Test point setting scheme generation method and device

Abstract

The embodiment of the invention provides a test point setting scheme generation method and device. The method comprises the following steps: determining a plurality of test schemes according to that whether each fault point is provided with a test point or not; determining the corresponding fault detection rate and fault isolation rate according to a fault test correlation matrix of each test scheme; and selecting the test scheme of which the total test point number is the least or less than a preset point number and the fault detection rate and the fault isolation rate are respectively greater than corresponding preset thresholds, wherein the fault test correlation matrix is obtained according to a product of a diagonal matrix and a fault propagation matrix constructed by a test scheme, and the elements in the fault propagation matrix represent whether the faults with the corresponding serial numbers have a propagation relationship or not. The method is obtained without artificial experience and has objectivity, while the test effect is guaranteed, the least test points are used, and thus the workload of test design is effectively alleviated. In addition, the automatic generationof the test scheme is facilitated, and meanwhile, the effectiveness and objectivity of the test scheme are ensured.

Description

technical field [0001] The invention relates to the technical field of fault detection, in particular to a method and device for generating a test point setting scheme. Background technique [0002] As the functions of weapons and equipment become more and more advanced, their internal structures become more and more complex. Usually, researchers will set up a large number of test points for the system in order to make the weapon equipment meet the required testability indicators when conducting testability design. At present, where to set test points is basically done by the designers based on experience, and there is no specific method to guide. If test points are set for each failure mode in the weapon equipment, then the testability level of the weapon equipment will be reduced. will reach the maximum. However, due to the large number of failure modes in large-scale weapons and equipment, too many test points will inevitably increase the complexity of testability analy...

AI Technical Summary

Problems solved by technology

However, due to the large number of failure modes in large-scale weapons and equipment, too many test points will inevitably increase the complexity of testability analysis, and will also greatly reduce the efficiency of fault diagnosis; For example, due to the limited internal space of the equipment, the difficulty of design is increased, the life cycle cost of weapons and equipment is increased, and too many BIT (built in test, internal automatic detection) circuits reduce the overall reliability, etc.

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