Test point setting scheme generation method and device
A test scheme and test point technology, applied in the field of test point setting scheme generation method and device, can solve problems such as increasing design difficulty, reducing fault diagnosis efficiency, increasing weapon equipment life cycle cost, etc., to ensure effectiveness and objectivity , reduce workload, and facilitate automatic generation of effects
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[0041] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.
[0042] figure 1 This is a flowchart of a method for generating a test point setting scheme provided by an embodiment of the present invention, such as figure 1 As shown, the embodiment of the present invention provides a method for generating a test point setting plan, including:
[0043] 101. Determine multiple test plans according t...
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