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A method for automatic analysis of the whole process of cryo-electron microscopy single particle analysis data

A technology for analyzing data and cryo-electron microscopy, applied in the fields of instruments, computing, character and pattern recognition, etc., can solve the problems of not being able to be intelligent, different people storing different data, not asking questions, etc.

Active Publication Date: 2021-04-27
上海月新生科信息科技有限公司
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] However, it does not propose a reasonable automatic analysis method for the whole process of data when performing single particle analysis for cryo-electron microscopy. Targeted processing and management of different data stored by people lacks an effective management method. In order to make up for this deficiency, a solution is now provided

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  • A method for automatic analysis of the whole process of cryo-electron microscopy single particle analysis data

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Embodiment Construction

[0082] like figure 1 As shown, a method for automatic analysis of the whole process of cryo-electron microscopy single particle analysis data, the method specifically includes the following steps:

[0083] Step 1: Data import Select the data directory and working directory; the data directory is the storage directory of the original data captured by the user through the acquisition software, which is set by the user; the working directory is the general directory where the intermediate files and result files generated by the software during calculation are located. It is set by the user, usually in the SSD path of the solid-state hard disk, to ensure the IO speed during calculation; tasks in different stages will generate corresponding subdirectories, and the directory structure can refer to RELION; select the existing parameter settings, and the user can import the previous Operational parameter settings;

[0084] Select the existing reference, 2D-reference as the particle s...

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Abstract

The invention discloses a method for automatic analysis of the entire process of single-particle analysis data of cryo-electron microscopy. The present invention uses the disclosed corresponding method to perform single-particle analysis of cryo-electron microscopy, and this process also has corresponding technical manifestations at the present stage; later obtained After the targeted data has been processed, it is stored with the help of the storage system; specifically, the refined data obtained by the data acquisition unit is firstly obtained, the refined data is transmitted to the identity binding unit, and the user’s data is obtained by the identity binding unit. The special value corresponding to the identity, and then transmit the special value together with the refinement data to the processor, monitor the refinement data with the help of the storage supervision unit, obtain the initial storage time of the refinement data, and then use related technologies to obtain the special value group Pi, Memory occupancy value group Zi, access times group Fi and storage time group Ci; the ranking values ​​are calculated according to these parameters, and the refined data are sorted from large to small according to the ranking values.

Description

technical field [0001] The invention belongs to the field of cryo-electron microscope data, and relates to a cryo-electron microscope particle analysis technology, in particular to a method for automatic analysis of the whole process of cryo-electron microscope single particle analysis data. Background technique [0002] The patent with the publication number CN108898180A discloses a deep clustering method for single-particle cryo-electron microscopy images, which includes the following steps: the first step, data preprocessing, and sending the data to an autoencoder for pre-training; the second step, Training the autoencoder: use the output vector features of the encoder to cluster; use the clustering results to calculate the loss function; use the stochastic gradient descent method to optimize the weight of the autoencoder; the third step is to input all the granular image data into the autoencoder to obtain Cluster the result and analyze the clustering accuracy rate, judg...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/00
CPCG06V20/695G06V20/698
Inventor 吴弘张翔王松
Owner 上海月新生科信息科技有限公司
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