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A Differential Interference Imaging System That Can Change Shearing Direction and Size Rapidly

A shearing direction and differential interference technology, applied in the optical field, can solve the problems of difficult adjustment of shearing prism shearing direction, use limitation, complex prism processing and debugging, etc., to achieve enhanced timeliness and convenience, simple structure, adjustment easy effect

Active Publication Date: 2021-09-24
SOUTH CHINA NORMAL UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Traditional differential interference imaging systems usually use Nomarski prisms to cut the object beam along the lateral direction. This method has some obvious disadvantages: first, special prisms are required, and the processing and debugging of prisms are quite complicated; second, using differential interference When the imaging system observes the sample, due to the different properties of the sample and the replacement of different magnification objective lenses, the shear amount needs to be changed to achieve a better observation effect. The traditional method is to replace different Normarski prisms, which increases the complexity of the operation; The third is that the shearing direction of the shearing prism is not easy to adjust, which greatly limits the use; the fourth is that the quantitative measurement of the sample cannot be realized, and it is difficult to meet the needs of data analysis.

Method used

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  • A Differential Interference Imaging System That Can Change Shearing Direction and Size Rapidly
  • A Differential Interference Imaging System That Can Change Shearing Direction and Size Rapidly
  • A Differential Interference Imaging System That Can Change Shearing Direction and Size Rapidly

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Experimental program
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Effect test

Embodiment 1

[0027] See attached figure 1 The transmission differential interference imaging system provided by Embodiment 1 of the present invention includes: a light source 101, a filter 102, a polarizer 103, a sample stage 104, an infinity imaging microscope objective lens 105, a lens tube lens 106, a first liquid crystal Variable retarder 107, first half wave plate 108, second liquid crystal variable retarder 109, third liquid crystal variable retarder 110, second half wave plate 111, fourth liquid crystal variable retarder 112 , a polarizer 113 , and an image sensor 114 .

[0028] Among them, the first liquid crystal variable retarder 107, the first half-wave plate 108, the second liquid crystal variable retarder 109, the third liquid crystal variable retarder 110, the second half-wave plate 111, the first The four liquid crystal variable retarders 112 together constitute a shearing assembly.

[0029] The light source 101 emits linearly polarized light with a center wavelength of 65...

Embodiment 2

[0043] See attached figure 2 The symmetrical transmission differential interference imaging system provided by Embodiment 2 of the present invention includes: a light source 201, an optical filter 202, a polarizer 203, a sample stage 204, an infinity imaging microscope objective lens 205, a barrel lens 206, and a first convex lens 207. First liquid crystal variable retarder 208, second liquid crystal variable retarder 209, half wave plate 210, third liquid crystal variable retarder 211, fourth liquid crystal variable retarder 212, second convex lens 213 , a polarizer 214 , an image sensor 215 .

[0044] Among them, the first convex lens 207, the first liquid crystal variable retarder 208, the second liquid crystal variable retarder 209, the half wave plate 210, the third liquid crystal variable retarder 211 and the fourth liquid crystal variable retarder 212 , and the second convex lens 213 together constitute a shearing assembly.

[0045] The light source 201 emits linearl...

Embodiment 3

[0060] See attached image 3 , the reflective differential interference imaging system provided by Embodiment 3 of the present invention includes:

[0061] Light source 301, optical filter 302, polarizer 303, sample stage 304, infinity imaging microscope objective lens 305, lens tube lens 306, beam splitter 307, first liquid crystal variable retarder 308, second liquid crystal variable retardation device 309 , quarter wave plate 310 , mirror 311 , analyzer 312 , image sensor 313 .

[0062] Wherein, the beam splitter 307 , the first liquid crystal variable retarder 308 , the second liquid crystal variable retarder 309 , the quarter wave plate 310 , and the mirror 311 together form a shearing assembly.

[0063] The light source 301 emits linearly polarized light with a center wavelength of 650 nm and a bandwidth of 40 nm, and the polarization direction is along the x-axis of the coordinate axis shown in the figure.

[0064] The filter 302 in this embodiment is used to adjust t...

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Abstract

The invention relates to a differential interference imaging system capable of rapidly changing the shearing direction and size, including: a light source, an optical filter, a polarizer, a sample stage, an infinite-distance imaging microscope objective lens, a lens tube lens, a shearing assembly, a detector polarizer, image sensor. The linearly polarized light emitted by the light source is adjusted by the optical filter to adjust the light intensity and the polarizer to adjust the polarization direction, then passes through the transparent sample placed on the sample stage, is collected by the infinity imaging microscope objective lens, and is imaged by the lens tube lens, the imaging beam The sheared component is divided into two beams of linearly polarized light fields whose polarization directions are perpendicular to each other and with a small shear amount, and then synthesized by the analyzer to form an interference light field, and finally a differential interference image is formed in the image sensor. The differential interference imaging system provided by the invention can be flexibly assembled on a conventional optical microscope, has a simple structure and is easy to implement, and can study the morphology and structure of a sample by performing high-quality quantitative phase measurement on a non-stained sample.

Description

technical field [0001] The invention relates to the field of optical technology, in particular to a differential interference imaging system capable of rapidly changing the shearing direction and size. Background technique [0002] Differential interference imaging system is widely used in the detection and imaging of transparent samples. Such as differential interference phase contrast microscope, it mainly cuts the interference imaging beam at a certain distance in the transverse direction, and converts the optical path difference of the two beams in different characteristic areas of the sample into intensity changes, producing a visual pseudo 3D (relief) effect. Therefore, the details of the transparent sample can be clearly observed. Compared with other types of microscopy techniques, it has the advantages of outstanding phase contrast, high spatial resolution and optical sectioning ability, and does not require fluorescent labeling and staining, so that in-situ observa...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45G01J3/02G01J3/12G01N21/45
CPCG01J3/45G01J3/0237G01J3/0224G01J3/0229G01J3/12G01N21/45G01J2003/1291G02B21/14G02B21/088G02F1/13G02F1/133638
Inventor 吕晓旭周成鑫钟丽云宁钦文刘胜德
Owner SOUTH CHINA NORMAL UNIVERSITY
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