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Method for forming CMOS on-chip three-dimensional structure

A three-dimensional structure, seed layer technology, applied in electrical components, electrical solid devices, circuits, etc., can solve the problems of difficult control, easy formation of defects, and long time consumption of dielectric and single crystal silicon processes, and achieves short electrical interconnection distance. The effect of reducing parasitics and improving product performance

Active Publication Date: 2020-08-25
SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The main problem is that the three-dimensional structure on the chip needs to form multiple layers of single crystal silicon to make CMOS devices
However, currently commonly used methods, such as monocrysta

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  • Method for forming CMOS on-chip three-dimensional structure
  • Method for forming CMOS on-chip three-dimensional structure
  • Method for forming CMOS on-chip three-dimensional structure

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Embodiment Construction

[0032] The core idea of ​​the present invention is to combine the laser crystallization technology into the CMOS process, provide a new technical method for forming the three-dimensional structure in the CMOS chip, and realize the three-dimensional structure of the CMOS structure in the chip with a feasible and reliable process method. Stacking, thereby increasing the density of on-chip CMOS transistors, reducing the required interconnection length, improving product performance, and reducing the cost of a single chip.

[0033] The specific embodiment of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0034] It should be noted that, in the following specific embodiments, when describing the embodiments of the present invention in detail, in order to clearly show the structure of the present invention for the convenience of description, the structures in the drawings are not drawn according to the general scale, an...

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Abstract

The invention discloses a method for forming a CMOS on-chip three-dimensional structure. The method comprises the following steps of forming an annular raised monocrystalline silicon seed layer regionon a silicon substrate; forming a first-layer CMOS transistor in a non-seed layer region; forming a first interlayer dielectric layer, and exposing the monocrystalline silicon seed layer region; covering the first interlayer dielectric layer with a polycrystalline silicon layer, and enabling the surfaces of the polycrystalline silicon layer and the first interlayer dielectric layer to be flush; heating to melt and recrystallize the polycrystalline silicon layer, and converting polycrystalline silicon into monocrystalline silicon by using monocrystalline silicon surrounding the polycrystallinesilicon to form a monocrystalline silicon layer; forming a second-layer CMOS transistor on the monocrystalline silicon layer; forming a second interlayer dielectric layer; and forming interconnectionbetween the first-layer CMOS transistor and the second-layer CMOS transistor. According to the invention, the density of the on-chip CMOS transistor can be increased, the required interconnection length is reduced, the product performance is improved, and the cost of a single chip is reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit manufacturing, in particular to a method for forming a three-dimensional structure in a CMOS chip. Background technique [0002] With the development of semiconductor VLSI, the existing technology has approached the physical limit. Driven by the further miniaturization and multi-functionalization of electronic products, other new technologies, new materials, and new technologies have been explored. Removing the two-dimensional limitation of the chip and developing the chip structure to three-dimensional is one of them. At present, the method of making three-dimensional structure can be roughly divided into two types, one is to stack silicon wafers through bonding technology to realize the metal interconnection structure on the three-dimensional level; the other is to make multi-layer CMOS transistors in the chip to realize On-chip 3D structure. [0003] The existing sil...

Claims

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Application Information

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IPC IPC(8): H01L27/118
CPCH01L27/11807
Inventor 葛星晨
Owner SHANGHAI INTEGRATED CIRCUIT RES & DEV CENT