Test fixture and test equipment

Abstract

The invention provides a test fixture and test equipment. The test fixture comprises a probe seat, a compensation structure and an electric connecting piece. The probe seat is provided with an accommodating groove and a probe insert port, wherein the probe insert port is communicated with the accommodating groove and is used for insertion of a probe of an electronic component. The compensation structure is used for compensating the length of the probe, one end of the compensation structure is electrically connected to the electric connecting piece, the end, away from the electric connecting piece, of the compensation structure extends into the accommodating groove and is used for being connected with the probe of the electronic element, and the electric connecting piece is used for being connected with a tester. When the test fixture is applied to an insertion loss test of a filter; the compensation structure can compensate the length of the probe, so that the situation that an insertion loss curve of the filter is biased due to pin shearing can be avoided, the insertion loss of the filter can be accurately measured, and the insertion loss test result of the filter can be comparedwith the initial value requirement and the stability of the filter can be judged.

Description

technical field [0001] The invention belongs to the technical field of insertion loss test fixtures, and more specifically relates to a test fixture and testing equipment. Background technique [0002] At present, the pins of the leading ends of the filters used in the market are all standard lengths. During the production, use and testing (vibration, shock, overload, moisture resistance and life, etc.) of the filters, the leading ends of the filters are all checked. Two or more times of processing (cutting or welding, etc.), the length of the lead-out end of the filter changes, resulting in a decrease in its distributed inductance, according to the formula: Such as figure 1 As shown (the capacity of the test product is 22pF), due to the decrease of the inductance L, the increase of the resonant frequency f, the insertion loss curve is biased, so many times the test results are quite different from the initial value, and the insertion loss of the filter The test results c...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the embodiments of the present invention is to provide a test fixture and test equipment to solve the technical problem in the prior art that it is difficult to accurately measure the insertion loss of the filter, resulting in the inability to determine the stability of the filter

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