Low-frequency noise testing device and method

Abstract

The invention discloses a low-frequency noise testing device and method. The device comprises a to-be-tested device module which is used for providing an external bias voltage for a to-be-tested device, enabling the to-be-tested device to work in a set state, and introducing a noise signal needing to be concerned by the to-be-tested device, a first device noise measurement path which is used for carrying out noise amplification and digital sampling on the first path of small signals output by the to-be-tested device module to obtain a first path of digital noise signals, a second device noisemeasurement path which is used for carrying out noise amplification and digital sampling on a second path of small signals output by the to-be-tested device module to obtain a second path of digital noise signals, a power supply noise extraction path which is used for extracting and digitalizing the noise of the power supply to obtain a digital noise signal of the power supply, and a frequency spectrum reconstruction module which is used for calculating the frequency spectrum density of the input signal according to the sampling data obtained by the three paths so as to obtain the frequency spectrum concerned in the low-frequency noise of the tested device.

Description

technical field [0001] The invention relates to the technical field of low-frequency noise testing, in particular to a low-frequency noise testing device and method. Background technique [0002] With the continuous improvement of the precision of electronic equipment, higher requirements are put forward for the stability of the device. The internal noise of the device has become a key factor restricting high-precision equipment. The fluctuation of carriers inside the device forms the main noise of the device. For this reason, the development of device noise testing and analysis has become one of the key means to measure the quality of devices. At the same time, there is a close relationship between the low-frequency noise characteristics of devices and the reliability of devices, which can become a key parameter of device reliability. [0003] With the continuous reduction of the size of the device under test, the low-frequency noise test value of the device is also conti...

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Problems solved by technology

[0012] However, the above scheme uses two preamplifier structures, which eliminates the differential mode noise between the channels, but cannot eliminate the common mode noise

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