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Product surface defect detection method and device, and equipment

A defect detection and defect location technology, applied in the computer field, can solve the problems of poor positioning, time-consuming and labor-intensive, and inability to detect small surface defects.

Pending Publication Date: 2020-09-11
ゼジャンハーレイテクノロジーカンパニーリミテッド
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides a product surface defect detection method, device and equipment, which are used to solve the problems of time-consuming and labor-intensive detection of surface defects of chemical fiber products in the prior art, the inability to detect small surface defects and poor positioning

Method used

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  • Product surface defect detection method and device, and equipment
  • Product surface defect detection method and device, and equipment
  • Product surface defect detection method and device, and equipment

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Embodiment Construction

[0100] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0101] The term "and / or" in the embodiments of the present invention describes the association relationship of associated objects, indicating that there may be three relationships, for example, A and / or B, which may mean: A exists alone, A and B exist simultaneously, and B exists alone These three situations. The character " / " generally indicates that the contextual objects are an "or" relationship.

[0102]The application scenarios de...

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PUM

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Abstract

The invention provides a product surface defect detection method and device, and equipment. The method comprises: obtaining an image and determining whether the image is a to-be-detected image needingto detect a specified type of defect or not; if yes, carrying out sliding sampling on the to-be-detected image by utilizing a sliding window through a pre-trained defect detection model, carrying outdefect detection on the sampled window area, and outputting a position identifier of the window area with defects in the to-be-detected image; carrying out image segmentation on the window area withthe defects by utilizing an image segmentation algorithm to obtain contour areas of the defects in the window area with the defects; and connecting the adjacent contour regions through a region growing algorithm to obtain the form and number of defects existing in the to-be-detected image. According to the invention, a sliding sampling detection mode can be carried out on an image, and the problems of time and labor waste, incapability of detecting surface fine defects and poor positioning performance in the prior art are solved.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a product surface defect detection method, device and equipment. Background technique [0002] With the rapid development of my country's manufacturing industry, the number and types of products produced by industry are also increasing. People's requirements for product quality are getting higher and higher. The quality of the product surface will not only affect the appearance of the product, but more serious functional defects will directly lead to the depreciation of the commercial value of the product. Due to the influence of equipment and process in the production of chemical fiber products, very small defects often appear in chemical fiber products, and even some defects are only the size of one pixel in width. When the small object to be tested moves, the human eye cannot distinguish the shape of the object to be tested well or even perceive the small object to be teste...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06K9/32G06K9/34G06N3/04
CPCG06T7/0004G06T2207/30124G06V10/25G06V10/267G06N3/045Y02P90/30
Inventor 崔浩黄虎
Owner ゼジャンハーレイテクノロジーカンパニーリミテッド
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