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SSD test system and SSD test method

A test system and test method technology, applied in the direction of faulty hardware test method, detection of faulty computer hardware, static memory, etc., can solve the problems of low test efficiency, insufficient test ability, and troublesome SSD test system test, and achieve the test process. The effect of simplifying and testing procedures, improving testing capability and testing efficiency, avoiding multiple plugging and power-on and power-off operations

Pending Publication Date: 2020-11-13
BIWIN STORAGE TECH CO LTD
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  • Summary
  • Abstract
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AI Technical Summary

Problems solved by technology

[0004] The present invention solves the problems of troublesome testing, insufficient testing ability and low testing efficiency of the current SSD testing system by proposing a SSD testing system and SSD testing method

Method used

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  • SSD test system and SSD test method
  • SSD test system and SSD test method

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Embodiment Construction

[0032] The solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0033] The embodiment of the present invention proposes a kind of SSD testing system, refer to Figure 1 to Figure 3 , the SSD test system includes a test host 10, an expansion board 20 and a plurality of SSD test carrier boards 30 connected in sequence, and the SSD test carrier board 30 is used to install SSD;

[0034] The test host 10 is configured to issue a test main signal corresponding to the function to be tested;

[0035] The expansion board 20 is used ...

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Abstract

The invention discloses an SSD test system, the SSD test system comprises a test host, an expansion board and a plurality of SSD test support boards which are connected in sequence, and the SSD test support boards are used for installing SSDs; wherein the test host is used for issuing a test main signal corresponding to a to-be-tested function; the expansion board is used for receiving the test main signal, analyzing the test main signal into a plurality of test sub-signals and issuing the test sub-signals to the SSD test carrier board; and the SSD test carrier plate is used for correspondingly receiving the test sub-signals so as to perform function test on a plurality of SSDs according to the test sub-signals. According to the SSD testing system, centralized testing of multiple functionsof the SSD can be achieved, the SSD function testing process is simplified, and the testing capacity and the testing efficiency are improved. In addition, the invention further discloses an SSD testing method.

Description

technical field [0001] The invention relates to the technical field of solid state disk testing, in particular to an SSD testing system and an SSD testing method. Background technique [0002] With the rapid development of the Internet, people's storage requirements for data information are also increasing. As a carrier for storing data information, SSD (Solid State Drives) has the characteristics of fast storage speed and low power consumption. It is widely used in vehicle, industrial control, video monitoring, network monitoring and many other fields. [0003] At present, during the production process of SSD, multiple tests such as a card opening test, RDT bad block test, BIT internal self-test and secondary card opening test are required to verify the integrity of its functions. However, in the existing SSD testing system, it is equipped with a corresponding test carrier board for testing each function of the SSD, that is, it has more test stations, and different test st...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F11/26G11C29/56
CPCG06F11/2273G06F11/26G11C29/56
Inventor 邹志明李振华
Owner BIWIN STORAGE TECH CO LTD
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