Standard sample size measurement method, system and application

A standard sample and measurement system technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as inability to classify samples, and achieve the effect of reducing time and errors

Pending Publication Date: 2020-11-17
NAT POLYMER MATERIALS IND INNOVATION CENT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problem that the sample measurement methods in the prior art cannot classify the samples, the present invention provides a standard sample size measurement method, system and application, which can effectively solve the above problems

Method used

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  • Standard sample size measurement method, system and application
  • Standard sample size measurement method, system and application
  • Standard sample size measurement method, system and application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment I

[0061] Embodiment 1: Since the sample 8 needs to be measured after the fixing assembly 5 is fixed, if the laser head is used for linear scanning measurement, the sample 8 needs to be fixed to prevent the sample 8 from moving and affecting the measurement result.

[0062] In actual work, such as Figure 5-6 , the measuring component 7 can measure the length, width and thickness of the sample 8 through the laser distance measuring unit; at the same time, in the process of using the laser distance measuring, in order to ensure the accuracy of the measurement result, the sample 8 is at rest through the fixed component 5 State, while the laser distance measuring unit on the measurement component 7 can move linearly, and measure the size data of the sample 8 by scanning.

[0063] Specifically, the fixing assembly 5 includes a base plate 501, a negative pressure unit 502, and a positioning unit 503 which are arranged on the frame 1 through bolts; wherein, the edge of the base plate ...

Embodiment II

[0071] Embodiment II: as Figure 10-11 , in actual work, the measurement component 7 can measure the length, width and thickness of the sample 8 through the CCD; since the CCD is used to measure the size of the object without linear motion, the sample 8 can be placed at a designated position.

[0072] In order to complete the CCD size measurement, the fixed assembly 5 includes a transparent bottom plate 501, a positioning unit 503 and an illumination unit arranged on the frame 1; the measurement assembly 7 includes a CCD linear array 704; wherein, the bottom plate The edge of 501 is provided with a row of at least two positioning units 503; wherein, the positioning unit 503 cooperates with the positioning device on the transfer manipulator 2, and is used to place the sample 8 in the object field of view of the imaging objective lens and place the CCD The linear array image sensitive surface is set on the best image plane position of the imaging objective lens, and the measurem...

specific Embodiment III

[0076] Specific embodiment III: Of course, in the process of specific implementation, it is also possible to adopt the mixed use of linear scanning method and CCD linear array 704 .

[0077] As: the fixed assembly 5 includes a transparent bottom plate 501, a positioning unit 503 and an illumination unit arranged on the frame 1; the measurement assembly 7 includes a CCD linear array 704 for measuring the length and width of the sample 8, The first sliding rail mechanism 701 for measuring the thickness of the sample 8;

[0078] Wherein, the edge of the bottom plate 501 is provided with a row of at least two positioning units 503 and cooperates with the positioning device on the transfer manipulator 2 for placing the sample 8 in the object field of view of the imaging objective lens and placing the CCD linear array The image sensitive surface is set on the best image surface position of the imaging objective lens, and the measurement is completed through the illumination of the l...

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Abstract

In order to solve the problem that samples cannot be classified in a sample measurement mode in the prior art, the invention provides a standard sample size measurement method and system and application, and the method comprises the following steps: S1, determining sample incoming material information through a code scanning assembly, sending the information to a control end, and forming a two-dimensional code corresponding to the sample through the control end; s2, positioning the sample scanned in the step S1; s3, spraying a two-dimensional code on the sample positioned in the step S2; s4, measuring the size of the sample sprayed with the two-dimensional code; and S5, classifying the types of the samples according to the size data obtained in the step S4. According to the system, the sample type database is preset through the visual device or the workstation, the problems of sample type recognition, classification, coding and the like when different types of samples are subjected tosize measurement at the same time are solved through comparison of measurement results and the database, and the time and errors of manual recognition are reduced.

Description

technical field [0001] The invention relates to the field of material performance testing, in particular to a standard sample size measurement method, system and application. Background technique [0002] A standard sample is actually a "reference value" that provides one or more quantities of a substance as a "reference value" for the accuracy of other measurements. Therefore, the measurement requirements for the sample are relatively high. [0003] Existing measurement of the size of test samples, one is to use micrometers and vernier calipers, and the other is an automatic measuring device. By integrating grating rulers and dial indicators into the automatic control mechanism, high-precision and automatic measurement is realized. However, the existing measurement methods and devices cannot classify the samples and need to be classified manually, resulting in messy data and chaotic post-management. [0004] In short, the existing measurement methods for samples have the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/00
Inventor 吴博庞承焕程春锋李卫领肖星
Owner NAT POLYMER MATERIALS IND INNOVATION CENT CO LTD
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