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Abutting jig and testing device

A testing device and jig technology, applied in the direction of measuring device, measuring device casing, electronic circuit testing, etc., can solve problems such as increasing the intensity of manual operation, the inability of automatic separation of the main board and the test terminal of the movement, and the quality of products.

Pending Publication Date: 2020-11-17
SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, the test terminal can be plugged into the vertical port of the main board of the movement through automated equipment for testing, but the main board of the movement and the test terminal cannot be separated automatically after the test, and the traditional method of manually plugging and unplugging the port is required to make the main board of the movement The port is separated from the test terminal, which not only increases the intensity of manual operation, but also takes more time, the test efficiency is low, and product quality problems caused by manual work are prone to occur.

Method used

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  • Abutting jig and testing device
  • Abutting jig and testing device
  • Abutting jig and testing device

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Embodiment Construction

[0035] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0036] It should be noted that all directional indications (such as up, down, left, right, front, back...) in the embodiments of the present invention are only used to explain the relationship between the components in a certain posture (as shown in the accompanying drawings). Relative positional relationship, movement conditions, etc., if the specific posture changes, the directional indication will also change accordingly.

[0037] In the present in...

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Abstract

The invention discloses an abutting jig and a testing device. The testing device comprises a driving piece and a testing terminal connected with the driving piece, the driving piece is used for driving the testing terminal to be inserted into a port of a mainboard to be tested, the abutting jig comprises a fixing piece, an abutting piece and an elastic piece, and the fixing piece is connected to the side, facing the testing terminal, of the driving piece; the abutting piece is movably connected to the fixing piece and used for abutting against the mainboard to be tested; one end of the elasticpiece is connected to the fixing piece, the other end of the elastic piece is connected to the abutting piece, and the elastic piece drives the abutting piece to move relative to the fixing piece. According to the technical scheme, the production test efficiency of a core mainboard is improved, the test time is saved, and the quality of the core mainboard is ensured.

Description

technical field [0001] The invention relates to the technical field of automatic testing, in particular to a pressure-resistance jig and a testing device. Background technique [0002] At present, product competition in the electronics industry is becoming more and more fierce, and it is an inevitable trend for the core motherboard manufacturing industry to use fully automatic testing. However, at present, the test terminal can be plugged into the vertical port of the main board of the movement through automated equipment for testing, but the main board of the movement and the test terminal cannot be separated automatically after the test, and the traditional method of manually plugging and unplugging the port is required to make the main board of the movement The separation of the port and the test terminal not only increases the intensity of manual operation, but also takes more time, the test efficiency is low, and product quality problems caused by manual work are prone ...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2856G01R31/2865G01R1/0408
Inventor 张忠亚温建斌周永欢杨家杰舒文帆林欢
Owner SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD