Array type MEMS sensor SPI parallel data acquisition circuit and acquisition method

A data acquisition circuit and data acquisition technology, applied in the direction of logic circuit connection/interface layout, etc., can solve the problems of unfavorable MEMS sensor application, MEMS sensor yield reduction, cost increase, etc., and achieve the effect of easy independent operation

Active Publication Date: 2020-11-17
SUZHOU UNIV
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Problems solved by technology

Because MEMS sensors have relatively large defects in measurement accuracy, measurement noise, etc., they are limited in actual use.
At present, improving the measurement accuracy of MEMS sensors and reducing their measurement noise mostly start with structural design and circuit system, which improves the performance of MEMS sensors to a certain extent, followed by a decrease in the yield rate of MEMS sensors and an increase in cost. Not conducive to the application of MEMS sensors

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  • Array type MEMS sensor SPI parallel data acquisition circuit and acquisition method
  • Array type MEMS sensor SPI parallel data acquisition circuit and acquisition method
  • Array type MEMS sensor SPI parallel data acquisition circuit and acquisition method

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Embodiment Construction

[0022] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.

[0023] The MEMS sensor has the defects of high noise and low measurement accuracy. For this reason, the present invention discloses a SPI parallel data acquisition method for an arrayed MEMS sensor. The method realizes the acquisition of multi-sensor array data through the SPI parallel data acquisition mode, and is a MEMS Sensor noise reduction offers a viable solution. The present invention provides the scheme design diagram of SPI parallel data acquisition, as figure 1 . figure 1 Among them, the clock line (SCLK), the host control line (MOSI), and the chip select line (nCS) of all sensors are respectively connected to the three I / O ports of the controller by a common line, whic...

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Abstract

The invention discloses an array type MEMS sensor SPI parallel data acquisition circuit and acquisition method, and aims to synchronously acquire data of a plurality of MEMS sensors in parallel and synchronously acquire a design scheme and a data acquisition time sequence of the plurality of MEMS sensors in parallel through an SPI communication bus. A signal driving and level switching circuit isdesigned; and a parallel data preprocessing and analyzing scheme is provided. Data of a plurality of MEMS sensors can be synchronously collected at the same time, and the device has the advantages ofbeing stable in communication, convenient to operate independently and the like.

Description

technical field [0001] The invention relates to the technical field of MEMS sensor systems, in particular to an array type MEMS sensor SPI parallel data acquisition circuit and acquisition method. Background technique [0002] At present, MEMS sensors are being more and more applied to the military, civilian and industrial fields, and their high cost performance and low power consumption characteristics have more and more broad application prospects. Because MEMS sensors have large defects in measurement accuracy, measurement noise, etc., they are limited in actual use. At present, improving the measurement accuracy of MEMS sensors and reducing their measurement noise mostly start with structural design and circuit system, which improves the performance of MEMS sensors to a certain extent, followed by a decrease in the yield rate of MEMS sensors and an increase in cost. It is not conducive to the application of MEMS sensors. Contents of the invention [0003] The technic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03K19/0175
CPCH03K19/0175
Inventor 徐祥朱辰霄颜陆胜申佼杰刘健明戴瑄辰
Owner SUZHOU UNIV
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