Integrated avionics equipment fault intelligent diagnosis system

A technology for avionics equipment and intelligent diagnosis, which is applied in the direction of measuring electricity, measuring electrical variables, and testing electrical devices in transportation. The effect of small false negative rate, improved fault identification ability, and high fault identification ability

Active Publication Date: 2020-12-15
10TH RES INST OF CETC
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  • Abstract
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  • Claims
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Problems solved by technology

[0007] In order to overcome the deficiencies of existing fault diagnosis methods, solve the problems of complicated case representations in complex systems, difficult fault diagnosis caused by modeling difficulties, no unified method, etc., as well as the shortcomings of cumbersome and complicated processes, the purpose of the invention is to: For the above existing problems, it is necessary to provide an integrated avionics fault intelligent diagnosis system with accurate fault location, low false alarm rate and missed alarm rate, high fault identification ability, and strong robustness, so as to overcome the fuzzy reasoning process of traditional fault diagnosis methods , threshold uncertainty and other issues

Method used

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  • Integrated avionics equipment fault intelligent diagnosis system
  • Integrated avionics equipment fault intelligent diagnosis system
  • Integrated avionics equipment fault intelligent diagnosis system

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Embodiment

[0046] When the system performs fault diagnosis and prediction, the following steps are included:

[0047] Firstly, the collected avionics data is read from the database of the system, leaving the ID number of the avionics and the failure time of the avionics. After the reading is completed, the failure time of the avionics device is converted into a time stamp, that is, the time at a certain moment is identified. Set the size of the time stamp according to the time interval of the collected data, such as days, hours, minutes, and milliseconds, and finally take the time difference between the next time stamp that failed and the time stamp that failed as the failure event sequence, and set The timestamp of the first failure is 0. Wherein, the first column represents the ID number of the device, and the second column represents the difference between the time stamp when the device fails at this time and the time stamp when the device failed last time. Each row represents the t...

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Abstract

The invention discloses an integrated avionics equipment fault intelligent diagnosis system, and aims to provide a diagnosis system which is accurate in fault positioning, high in fault identificationcapability and strong in robustness. The system is realized through the following technical scheme: a data preprocessing module converts acquired equipment data into a difference value of equipment fault timestamps, and the two columns of data are stored into a first database as a fault event sequence; a Hawkes process module periodically sends a detection signal, judges whether the system has afault and the type of the system fault, diagnoses the fault type, the fault part and the reason, and sends the detected fault signal to a survival analysis and prediction module to identify the faultsize and the time-varying characteristic, a time dependent variable is introduced, a proportional risk regression model COX regression model is constructed by taking survival outcome and survival timeas dependent variables, a survival function is obtained from the Hawkes process module, and fault analysis is performed according to units of different fault timestamps to complete a fault diagnosistask.

Description

technical field [0001] The invention belongs to the field of time series point process in the field of machine learning, and relates to a system for diagnosing the fault of integrated avionics equipment through survival analysis based on Hawkes Process. Background technique [0002] With the rapid development of large-scale integrated circuit technology and its increasingly wide application, in order to maintain various devices and equipment, people must use computers to find circuit faults. Analog circuit fault diagnosis has become an eye-catching topic in large-scale integrated circuits. of a subject. The problem of fault diagnosis and location of analog circuits has not only attracted widespread attention, but is also a major problem in the design and use of electronic systems by experts at home and abroad. Among them, the fault diagnosis of large-scale nonlinear complex circuits, that is, soft fault diagnosis, is also a problem that plagues the masses. Problems for scie...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G06N3/04G06N3/08
CPCG01R31/008G06N3/08G06N3/048
Inventor 陈文豪黄明李骁雷志雄乔文昇
Owner 10TH RES INST OF CETC
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