A test device for a carrier-type bare-chip power amplifier module
A technology of a power amplifier module and a test device, which is applied to measurement devices, measurement device casings, radio frequency circuit testing, etc., can solve the problems of difficult electrical performance index testing, small circuit structure space, and fragile surface bare chips, so as to avoid surface chip damage. Risk, ensure reliability, and test the effect of low cost
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[0036] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but the embodiments described in the present invention are some of the embodiments of the present invention, not all of them .
[0037] It should be noted that like numerals and letters denote similar items in the following figures, therefore, once an item is defined in one figure, it does not require further definition and explanation in subsequent figures.
[0038] In describing the present invention, it should be noted that the terms "centre", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" etc. indicate The orientation or positional relationship of the invention is based on the orientation or positional relationship shown in the drawings, or the orientation or positional relationship that is usually p...
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