Signal test system and method without radio frequency test socket with symmetrical tuning unit

A technology of radio frequency test socket and tuning unit, which is applied in transmitter monitoring, receiver monitoring, etc., can solve the problems of limited motherboard design space, increased material cost of wireless products, and failure to improve the quality of radio frequency signal transmission and reception on wireless product boards, etc., to achieve Save adjustment time and verification time, reduce operational complexity, and ensure effectiveness

Active Publication Date: 2021-06-25
深圳合一测试科技有限公司
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, more RF test sockets are added to the motherboard of wireless products through the design and development stage; the number of RF test sockets on the motherboard of wireless products in the 2-4G era is calculated in single digits, and this number will rise to 10 in the 5G era The above is to meet the needs of traditional board-level RF testing; for wireless products with increasingly complex designs, higher performance, and better user experience, the design space on the motherboard is very limited, and more than 10 RF test sockets It is only to meet the test requirements of ensuring the quality of radio frequency signals before the launch of wireless products, and does not improve the quality of sending and receiving radio frequency signals on the board of wireless products after listing
Instead, it is necessary to reserve more than 10 board-level RF test socket installation spaces on the limited motherboard space in the wireless product design stage, and increase the material cost of wireless products

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Signal test system and method without radio frequency test socket with symmetrical tuning unit
  • Signal test system and method without radio frequency test socket with symmetrical tuning unit
  • Signal test system and method without radio frequency test socket with symmetrical tuning unit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0065] see Figure 5 , the figure shows the specific circuit form of the antenna matching circuit and symmetrical tuning unit of a certain brand of wireless product motherboard. PORT1 represents the RF chip end, PORT2 represents the test instrument end, and the antenna shrapnel (ANT CLIPCONTACT) to PORT1 is the antenna The matching circuit is composed of capacitor C2 and inductor L3. The circuit between the antenna shrapnel and PORT2 is a symmetrical tuning unit, from Figure 5 It can be seen that the circuit of the symmetrical tuning unit and the antenna matching circuit are matched together to form a dual-port symmetrical structure network, and the purpose is to ensure the symmetry of the RF S parameters of port 2 (PORT2) and port 1 (PORT1). Since the antenna supports the two frequency bands N78 and N79 at the same time, according to the composition of the wireless product antenna matching (capacitor C2 and inductor L3), after debugging, it is found that it is necessary to u...

Embodiment 2

[0081] see Figure 10 , Figure 17-19 , Figure 10 There are three circuit parts, ABC, respectively, and the C part circuit is the antenna matching circuit of the wireless product motherboard (4G antenna). The matching form used in the frequency band is to adjust the circuits of parts A and B to achieve the overall symmetrical form of ABC when the circuit of part C is changed; part B is the tuning circuit part, and part A is the symmetrical circuit part. After debugging, it is found that the single-pole double-throw RF switches U4 and U5 in the B frame need to be used to switch the π-type tuning circuit series adjustable capacitor C224, and the single-pole four-throw RF switches U6 and U7 in the B frame need to be used. In order to ensure symmetry, the values ​​of the components switched to the ground must be the same for the switching of the component values ​​on the two branches connected in parallel to the ground of the tuning circuit.

[0082] When the RF chip works in ...

Embodiment 3

[0094] see Figure 20 , Figure 21-23 , Figure 20 There are three circuit parts, ABC, respectively, and part C is the antenna matching circuit of the main board of wireless products. The antenna matching circuit uses a Tuner chip to switch antenna matching circuits of various frequency bands. The specific frequency bands include B1, B3, B40, and B41. , N78; part C lists the antenna matching circuits in various frequency bands; at the same time, part A is a part of the circuit of the symmetrical coordination unit, in order to match with part C, a tuner chip is used to form a symmetrical form; in frame B, it is to form a whole A circuit with a symmetrical network and capable of impedance matching; during debugging, it is found that it is necessary to use single-pole double-throw RF switches U4 and U5 to switch between the π-type tuning circuit and the T-type tuning circuit; use the single-pole four-throw RF switch in the B frame U6 and U7 switch the component values ​​of the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention is a non-radio frequency test seat signal test system with a symmetrical tuning unit, which is applied to a test system without a radio frequency test seat; when in use, a radio frequency test probe, a symmetrical tuning unit and a test instrument module are used, and the radio frequency test probe connects the antenna The matching circuit is connected to the symmetrical tuning unit, the symmetrical tuning unit is connected to the test instrument module, the symmetrical tuning unit is used to match the antenna matching circuit, and a symmetrical two-port radio frequency path is formed between the radio frequency chip and the test instrument. The symmetrical tuning unit and the antenna matching circuit form a symmetrical radio frequency path, which ensures that the return loss of the two directions of the radio frequency path is very close, so as to achieve the purpose of ensuring the authenticity of the detection effect when detecting from one direction, and ensure the dual-port network of the entire radio frequency path Excellent RF performance, on the basis of reducing RF test sockets, reduces the operational complexity of impedance matching, saves adjustment time and verification time, and ensures the effectiveness of the detection effect.

Description

technical field [0001] The invention relates to the technical field of radio frequency signal testing, in particular to a signal testing system and method without a radio frequency test seat with a symmetrical tuning unit. Background technique [0002] In recent years, with the continuous development of communication technology, the popularity of wireless products has become higher and higher, and the number of wireless products produced in the world is also increasing every year, and people's production and life are becoming more and more convenient. Wireless products (represented by mobile phones) mainly refer to the communication frequency of 300kHz ~ 300GHz, and the communication signals in this frequency range are also called radio frequency signals. In order to ensure the quality of the RF signal on the motherboard of wireless products and meet a series of the most basic wireless communication requirements of wireless products, it is usually necessary to perform board-...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/15H04B17/29
CPCH04B17/15H04B17/29
Inventor 唐锡辉刘好左达恒
Owner 深圳合一测试科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products