Wavelet transform-based product surface defect detection method, memory and processor

A wavelet transform, defect detection technology, applied in image data processing, optical testing flaws/defects, instruments, etc., to achieve the effect of good application promotion value, simple debugging, and intuitive parameter debugging process

Active Publication Date: 2021-01-29
深圳华工量测工程技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] In order to overcome the deficiencies of the above-mentioned prior art, the present invention provides a product surface defect detection method, memory and processor based on wavelet transform. The method only needs to adjust the wavelet kernel size and wavelet direction to adaptively filter complex images Background, highlighting defect areas, to achieve the purpose of detecting different types of defects with one method

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  • Wavelet transform-based product surface defect detection method, memory and processor
  • Wavelet transform-based product surface defect detection method, memory and processor
  • Wavelet transform-based product surface defect detection method, memory and processor

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Embodiment Construction

[0042] The technical solutions of the various embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts fall within the protection scope of the present invention.

[0043] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or described herein...

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Abstract

The invention discloses a wavelet transform-based product surface defect detection method, a memory and a processor. The method comprises the steps of: reading an original image of a product; inputting the size and wavelet direction of a wavelet kernel; generating the wavelet kernel through wavelet transform calculation; carrying out convolution operation through the wavelet kernel and the original image of the product so as to obtain a filtered image; and filtering out a complex image background in a self-adaptive mode, highlighting a defect area. For different types of defects, wavelet kernels and wavelet directions of different sizes can be input for defect detection, the purpose of detecting different types of defects through one method is achieved, image processing algorithms do not need to be developed for certain types or several types of defects respectively, and the development cost is greatly reduced.

Description

technical field [0001] The invention relates to the technical field of product surface defect detection, in particular to a product surface defect detection method based on wavelet transform, a memory and a processor. Background technique [0002] At present, with the development of the machine vision industry, more and more machine equipment is used to replace manual visual inspection for product surface defect detection. In appearance inspection, common defects include scratches, abrasions, punctures, concave-convex pits, stamping, edge chipping, discoloration, lack of ink, etc. These defects are usually distributed in different areas of the product, and because different types of defects appear in different positions, the defect backgrounds are different, which brings great inconvenience to image analysis. [0003] The mainstream inspection equipment in the industry basically uses industrial cameras to collect pictures and then uses software algorithms for image analysis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06T7/136G06T5/20G01N21/88
CPCG01N21/8851G01N2021/8887G06T5/20G06T7/0004G06T2207/20024G06T2207/20064G06T7/11G06T7/136
Inventor 吴巍刘亮王建刚
Owner 深圳华工量测工程技术有限公司
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