Eye pattern testing method and device, electronic equipment and readable storage medium
A test method and eye diagram technology, applied in register devices, memory systems, machine execution devices, etc., can solve the problems of long test time and low efficiency
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[0047] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is only a part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0048] Please refer to figure 1 , figure 1 It is a flow chart of an eye diagram testing method provided in the embodiment of this application. The method includes:
[0049] S101: Obtain target data, and write the target data into a target file.
[0050] Part or all of the steps of the eye diagram testing method provided in ...
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