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J750 system data downloading method and system, electronic equipment and storage medium

A data download and testing system technology, applied in static memory, electrical digital data processing, natural language data processing, etc., can solve problems such as crashes, inability to embed Flash chips in batches of Flash data downloads, and computer crashes. The effect of avoiding computer crashes and shortening the test time

Pending Publication Date: 2021-03-16
BEIJING CHIPADVANCED
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is only suitable for modifying vectors with a small amount of data. Because the real-time modification in the test takes a long time, and the second is that the length of the modified vector is limited. The larger the amount of modified data, the longer it takes, and it will cause the computer to crash.
The embedded Flash chip needs to download batches of Flash data. In addition to the function and parameter test (the same part of all chips), it is necessary to write different vectors of large batches of Flash data, in which different parts of each chip, into different chips. The method of ModifyPattren cannot download the batch Flash data of the embedded Flash chip on the J750 test system, and the data volume is too large, which may easily cause a crash

Method used

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  • J750 system data downloading method and system, electronic equipment and storage medium
  • J750 system data downloading method and system, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0082] Embodiment 1, step 1, convert the flash data file of the VCD format of a chip into the Flash download data test pattern text template file download_change_demo.atp of J750 format. Different Flash data in a chip. The flash data file of a chip in VCD format is provided by the customer. Use the test vector conversion tool to convert the VCD file into the J750 test vector text file download_change_demo.atp. This file includes the same Flash data to be downloaded to all chips and to be downloaded to Different Flash data in a chip;

[0083] Step 2, use the download_change_demo.atp file as a template, write software, modify the data in different locations in download_change_demo.atp by using different Flash data files (*.txt) of all chips to be tested, and generate the Flash download data J750 of the chip to be tested Test graphic text file (*.atp), corresponding to each chip, the customer provides a file data_000000001.txt with different download parts of Flash data, and bat...

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Abstract

The invention discloses a J750 system data downloading method and system, electronic equipment and a storage medium, and relates to the field of data batch processing. The method comprises the following steps: step 1, converting a Flash data file of a chip to be tested into a Flash download data test graphic text template file in a J750 format; step 2, processing the Flash download data test graphic text template file through an algorithm, and obtaining a J750 test graphic text file of the Flash data file; step 3, converting the J750 test graphic text file of the Flash data file into a J750 binary test graphic file; and step 4, downloading the J750 binary test graphic files in batches. The problems of long time, limited modified vector length, computer crash and the like can be solved.

Description

technical field [0001] The invention relates to the technical field of data batch processing, in particular to a J750 system data download method, system, electronic equipment and storage medium. Background technique [0002] Usually, for the mass production test of the same type of chip, the Pattern in the test program used by all chips is the same. You only need to load the test main program and Pattern once before the test. In addition to the functional test and DC parameter test of the embedded Flash chip, the routine test of the mass production of the embedded Flash chip, according to customer needs, some need to identify the uniqueness of each chip to ensure the security of chip information and effectively prevent information overlap. It is necessary to use special coding rules to write the unique information of the chip into the chip; the unique information written into the chip identification is mainly the factory code SN and UID code. These unique information need ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G06F40/151
CPCG11C29/56004G06F40/151
Inventor 张琳
Owner BEIJING CHIPADVANCED
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