Check patentability & draft patents in minutes with Patsnap Eureka AI!

Array substrate and manufacturing method thereof

A technology of an array substrate and a manufacturing method, applied in the field of panel display, can solve the problems of inability to effectively contact pixel electrodes 18, large step difference, and missing common electrodes 16, etc.

Inactive Publication Date: 2021-03-19
NANJING CEC PANDA LCD TECH
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The first contact hole H1 is a shallow hole, and the second contact hole H2 is a deep hole. The step difference between the first contact hole H1 and the second contact hole H2 is relatively large, which often causes the common electrode 16 under the first contact hole H1 to be overcut. The common electrode 16 is missing and cannot be effectively contacted with the pixel electrode 18, thereby affecting the connection between the common electrode and the gate metal layer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Array substrate and manufacturing method thereof
  • Array substrate and manufacturing method thereof
  • Array substrate and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0037] The manufacturing method of the array substrate of the present invention, such as image 3 and Figure 4 shown, including the following steps:

[0038] S1: depositing a first metal layer on the glass substrate 11, and etching the first metal layer to form a patterned gate metal layer 12;

[0039] S2: depositing the gate insulating layer 13 covering the gate metal layer 12;

[0040] S3: forming a semiconductor layer (not shown) on the gate insulating layer 13;

[0041] S4: depositing a second metal layer, etching the second metal layer to form a source electrode and a drain electrode respectively in contact with the semiconductor layer, and a source-drain pad layer 14 located above the semiconductor layer, the length of the source-drain pad layer 14 is d1 ;

[0042] S5: depositing the first insulating layer 15 covering the second metal layer;

[0043] S6: First deposit the organic insulating layer 16 covering the first insulating layer 15; then etch the organic insu...

no. 2 example

[0049] Second embodiment: as Figure 5 and Image 6 As shown, the difference from the above-mentioned first embodiment is: in step S8, the second insulating layer 18 and the common electrode 17 located in the first contact hole 101 are etched to form a second contact located on the source-drain pad layer 14 hole 102 .

[0050] That is to say, the common electrode 17 is etched when the second contact hole 102 is formed in the second embodiment. The specific manufacturing method of the second embodiment includes the following steps:

[0051] S1: depositing a first metal layer on the glass substrate 11, and etching the first metal layer to form a patterned gate metal layer 12;

[0052] S2: depositing the gate insulating layer 13 covering the gate metal layer 12;

[0053] S3: forming a semiconductor layer (not shown) on the gate insulating layer 13;

[0054] S4: depositing a second metal layer, etching the second metal layer to form a source electrode and a drain electrode respe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a manufacturing method of an array substrate and a manufacturing method of the array substrate. The manufacturing method of the array substrate comprises the following steps: S1, forming a patterned gate metal layer; S2, forming a gate insulating layer; S3, forming a semiconductor layer; S4, forming a source-drain cushion layer; S5, depositing a first insulating layer; S6, forming a first contact hole; S7, forming a common electrode; S8, forming a second contact hole, wherein the second contact hole and the first contact hole are communicated with each other; S9, forminga pixel electrode, enabling the pixel electrode to be in contact with the common electrode through the second contact hole, and enabling the pixel electrode to be in contact with the gate metal layerthrough the third contact hole. According to the array substrate, the organic insulating layer and the first insulating layer are etched under the common electrode, so that the segment difference between deep and shallow contact holes is reduced, and the over-etching problem of the common electrode is reduced; meanwhile, the source-drain cushion layer positioned on the semiconductor layer is added, so that the pixel electrode is over-etched and is connected with the common electrode through the source-drain cushion layer.

Description

technical field [0001] The present invention relates to the technical field of panel display, and in particular, to an array substrate and a manufacturing method thereof. Background technique [0002] The liquid crystal display device is the most widely used flat panel display device at present. The liquid crystal display panel includes an array substrate and a color filter substrate arranged oppositely. The array substrate is manufactured by a multi-patterning process to form a plurality of thin film patterns. Processes include masking, exposure, development, etching, and stripping. In order to reduce the price of liquid crystal display panels and improve product yield, technicians are working to reduce the number of patterning processes. [0003] Usually, the array substrate using IGZO semiconductor is made by 9 mask processes. In order to reduce the material cost, 7 mask processes are developed. The 7 mask process reduces the etching barrier layer ES and the gate insulati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L27/12H01L21/77G02F1/1362G02F1/1368
CPCG02F1/136227G02F1/1368H01L27/1214H01L27/1222H01L27/1259
Inventor 孙语琳王海宏卞存健费米
Owner NANJING CEC PANDA LCD TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More