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Power-on self-test method and device

A power-on self-test and start timing technology, applied in the computer field, can solve problems such as self-test failure, and achieve the effect of improving the success rate and reliability

Inactive Publication Date: 2021-03-26
BEIJING L&S LANCOM PLATFORM TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The embodiment of the present application provides a power-on self-test method and device to at least solve the technical problem that the power-on self-test method in the prior art is likely to cause self-test failure

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  • Power-on self-test method and device

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Embodiment Construction

[0023] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0024] It should be noted that the terms "first" and "second" in the description and claims of the present application and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such...

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Abstract

The invention discloses a power-on self-test method and a power-on self-test device. The method comprises the following steps: configuring a main starting assembly and a standby starting assembly; controlling the main starting assembly to execute power-on self-test; and under the condition that the main starting assembly fails to execute the power-on self-test, switching to the standby starting assembly to execute the power-on self-test. The technical problem that a power-on self-test mode in the prior art is prone to causing self-test failure is solved.

Description

technical field [0001] The present application relates to the field of computers, in particular, to a method and device for power-on self-check. Background technique [0002] BIOS is a set of programs solidified on a ROM chip on the motherboard of the computer. It stores the most important basic input and output programs of the computer, the self-test program after power-on and the system self-starting program. It can read and write system settings from the CMOS. specific information. Its main function is to provide the computer with the lowest and most direct hardware setting and control. BIOS also provides some system parameters to the operating system. Changes to system hardware are hidden by the BIOS, and programs use BIOS functions instead of directly controlling the hardware. [0003] The BIOS setting program is stored in the BIOS chip. The BIOS chip is a rectangular or square chip on the motherboard. It can only be set when the computer is turned on. The BIOS sett...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F9/4401
CPCG06F9/4401G06F11/2236G06F11/2273
Inventor 王振真
Owner BEIJING L&S LANCOM PLATFORM TECH
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