Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Relay accelerated storage degradation experiment parameter test analysis system and test method

A degradation experiment and parameter testing technology, applied in the field of measurement and analysis, can solve problems such as lack of reliability of relays, incomplete test parameters, etc., and achieve the effect of simple operation steps

Pending Publication Date: 2021-04-06
JIANGSU UNIV OF SCI & TECH
View PDF6 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to solve the problem that there is no real-time continuous monitoring of relay reliability and incomplete test parameters in the accelerated storage degradation test of general electromagnetic relays in the past

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Relay accelerated storage degradation experiment parameter test analysis system and test method
  • Relay accelerated storage degradation experiment parameter test analysis system and test method
  • Relay accelerated storage degradation experiment parameter test analysis system and test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0042] Example: such as figure 1 As shown, a relay storage degradation experiment parameter test analysis system includes:

[0043] Electromagnetic relay storage degradation experiment environment simulation test box 1: switch the relay to be tested to this box in turn through the conversion module, and accelerate the storage degradation process of the electromagnetic relay by simulating the high temperature environment;

[0044] Load box 2: Provide the load conditions required for the storage parameter test. According to the provisions of the national standard GJB65B-1999, the load power supply of the relay contact during the voltage parameter test is DC 6V / 100mA. When measuring contact bounce, action and release time, the coil is charged with rated voltage, and the contact load is resistive 10mA (maximum value), 6 V (DC maximum value or AC peak value);

[0045] Electromagnetic relay storage degradation parameter measurement and control box 3: connect the electromagnetic rel...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of measurement and analysis, and particularly relates to a relay accelerated storage degradation experiment parameter test analysis system and a test method, and is suitable for a universal electromagnetic relay. The system comprises an accelerated degradation experiment environment simulation experiment box, a load box, a relay storage degradation parameter measurement and control box, a lower computer, an upper computer and a PC. The storage degradation parameter test system has the function of testing the action voltage, the action time, the release voltage, the release time, the bounce time, the coil resistance and the contact resistance (or contact voltage drop) of the relay in the accelerated storage degradation experiment process. The method comprises the steps that firstly, the relay is placed in the accelerated storage degradation experiment environment simulation constant-temperature box, the humidity and the temperature needed by the accelerated storage experiment are set in the lower computer, and the upper computer calculates, stores and analyzes collected data for evaluating the storage reliability of the electromagnetic relay.

Description

technical field [0001] The invention relates to the technical field of measurement and analysis, in particular to a relay accelerated storage degradation experimental parameter test and analysis system and test method, which are suitable for general electromagnetic relays. Background technique [0002] The electromagnetic relay controls the circuit through the connection or disconnection of the contacts. It has the advantages of high conversion depth and good physical isolation performance. It is widely used in automatic control systems, power protection systems and communication systems, and plays a role in control, detection, protection and adjustment. It is one of the indispensable basic elements of cutting-edge national defense technology, advanced industrial and civilian equipment. As an important device of the national defense military weapon control system, the electromagnetic relay is often in the same storage state as the weapon system, and its storage reliability h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/327G01R31/00G01R27/20G01M13/00
CPCG01R31/3278G01M13/00G01R27/205G01R31/003
Inventor 王召斌李维燕尚尚陈康宁李朕刘百鑫乔青云
Owner JIANGSU UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com