Frozen electron microscope single particle image registration method based on Fourier power spectrum
A cryo-electron microscope and image registration technology, applied in the field of image processing, can solve problems such as time-consuming algorithm, inability to guarantee convergence speed, weak noise resistance, etc., to improve robustness, reduce registration time, and reduce impact Effect
Active Publication Date: 2021-04-06
SHANGHAI JIAO TONG UNIV
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[0026] In this embodiment, the Fourier transform adopts the fast Fourier transform, and the image rotation and translation transform adopts bilinear interpolation, and the rotation centers are all image centers. The registration algorithm of this embodiment has no special requirements on the reference image generation method, and this example only provides a generation method in the dataset registration so as to have a clearer understanding of the whole process.
[0027] Such as figure 2 Shown is a real cryo-EM single particle image of GroEL protein. The dataset consists of 4096 cryo-EM single-particle images of 128×128 GroEL proteins. GroEL is a structure with D7 symmetry, and the goal of registration is to correct all images to the same orientation. The goal of subsequent clustering was to cluster single particle images in the dataset into 32 categories, and the goal of reconstruction was to generate the 3D structure of GroEL.
[0028] Such as figure 1 As shown, this em...
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The invention provides a frozen electron microscope single-particle image registration method based on a Fourier power spectrum. The method comprises the steps that: power spectrum high-pass filter parameter estimation is conducted on a frozen electron microscope single-particle image set to be detected; the Fourier power spectrum of an image to be registered is calculated, feature points are extracted, and the image to be registered is corrected after reverse rotation is conducted on the image to be registered according to the feature points; on the basis of the rotation periodicity of the Fourier power spectrum, another relative rotation angle is calculated according to the feature points, then relative reverse rotation and relative correction are carried out; and finally, similarity calculation is carried out on the corrected image obtained by correction and relative correction and a target image, and the corrected image with the highest similarity is taken as a registration parameter result. According to the method, noise, particles and background are effectively separated by using Fourier power spectral domain analysis, meanwhile, the calculation performance of the algorithm is greatly improved based on effective implementation of the fast Fourier transform, and registration parameters can be directly calculated without iterative correction; and therefore, the calculation speed, the precision and the robustness of registration are improved.
Description
technical field [0001] The present invention relates to a technique in the field of image processing, in particular to a method for registration of cryo-electron microscope single particle images based on Fourier power spectrum. Background technique [0002] In the detection process of cryo-electron microscopy, in order to ensure that the activity of biological macromolecules is not affected by electron radiation as much as possible, the electron dose used by the electron microscope must be kept at a very low level, resulting in large noise in the cryo-electron microscope single particle image, and the signal The noise ratio is extremely low (usually as low as below 0.1). The analysis technology of cryo-EM images includes two-dimensional analysis technology and three-dimensional analysis technology. Two-dimensional analysis technology mainly clusters images to reduce noise to obtain clearer electron microscope images, while three-dimensional analysis technology reconstructs ...
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Login to View More IPC IPC(8): G06T7/33G06F17/14
CPCG06T7/33G06F17/142
Inventor 陈宇轩沈红斌
Owner SHANGHAI JIAO TONG UNIV