Dynamic system testing method and related devices

Abstract

The invention relates to a dynamic system testing method and a related device, and relates to the technical field of artificial intelligence, and the method comprises the steps of obtaining test data which comprises the object types, keywords, object test data and test interface methods of all test objects; determining a test method type corresponding to each test object according to the object type, wherein the test method type comprises a first type and a second type; taking the keyword of the test object corresponding to the first type as the name of a test method, taking a test interface method as the test logic of the test method, and generating a first test method by using the object test data; obtaining a preset second test method according to the keyword of the test object corresponding to the second type; and executing the first test method and the second test method to complete the test. According to the invention, the system on the blockchain node can be dynamically tested in the blockchain, and the test reliability is effectively improved.

Description

Technical field[0001]The present application relates to artificial intelligence technology, and in particular, there is a dynamic system testing method and related device.Background technique[0002]At present, there is usually the test code logic in the test, which is not only difficult to maintain, but also the problem that is easily error. The framework as an example of JUnit test is a tool during the development process. The test case prepared based on this framework is an important part of the software quality and an important part of the continuous integration process. Among them, the most commonly used parameterized test framework is mainly for different inputs, and it is a valid tool that determines if the system processing result is correct. The parametric test framework of JUnit must perform the same test method for each of the different test data performed each time. In fact, some test methods may be unnecessary for certain input test data. On the other hand, some data may ...

AI Technical Summary

Problems solved by technology

In fact, some test methods may not be necessary for some input test data

On the other hand, some data may require some special tests that other data do not

Although it is possible to list all test methods, and then use the Assume class to determine whether to execute the test according to the data, it will cause the following problems: the test code logic is complex, not only difficult to maintain, but also prone to errors, and a large number of skipped tests will appear in the test results , and cannot be distinguished from tests that are temporarily skipped by annotations (usually needs to be completed but have no time to process), resulting in low reliability of system tests

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