Photoelectron collision testing machine
A collision test and optoelectronic technology, which is applied in the field of optoelectronics, can solve the problems of insufficient research and development and test methods, and achieve the effect of fast speed, stable speed and clear camera
Active Publication Date: 2021-04-16
江苏锡沂高新材料产业技术研究院有限公司
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Problems solved by technology
[0002] With the increasing development and wide application of optoelectronic technology, the optoelectronic industry has entered many fields and has a very important position, which also makes it a high-tech industry that cannot be ignored. development space, but there are obvious deficiencies in research and development and test methods. In order to solve this problem, a photoelectron collision tester is disclosed.
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[0022] The present invention will be further described below in conjunction with specific embodiments. The exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not as a limitation to the present invention.
[0023] Such as figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Figure 6 , Figure 7 An optoelectronic crash tester shown includes a crash test device 1 , a camera moving up device 2 , a camera rotating device 3 and a camera fine-tuning device 4 .
[0024] The crash test device 1 includes a photon input pipe 106 , a moving rack 107 , and a glass upper cover 108 . The camera moving up device 2 includes a middle left driven spur gear 219 , a right driven spur gear 221 , and a slide block 222 . The imaging rotating device 3 includes a connecting plate 301 . The camera fine-tuning device 4 includes a rotating device connecting plate 401 and a rotating driven helical gear 402 .
[0025]The photon inpu...
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The invention discloses a photoelectron collision testing machine. The testing machine comprises a collision testing device, a camera shooting upward moving device, a camera shooting rotating device and a camera shooting fine tuning device which are arranged on a rack, and photoelectrons enter the middle inside the device through a photon input pipeline on the collision testing device; and positive and negative electrons are input into other substance input pipelines on the collision test device to carry out a collision test on photons, meanwhile, the camera shooting upward moving device drives the high-speed camera to move upwards in an arc shape, and a mechanical set in the camera shooting rotating device operates to drive the high-speed camera to carry out 360 DEG rotating camera shooting, so that omnibearing moving camera shooting recording is achieved. And a mechanical group in the camera shooting fine adjustment device operates to focus photoelectrons and other substances which are collided so as to ensure the definition of camera shooting records.
Description
technical field [0001] The invention relates to the field of optoelectronics, in particular to an optoelectronic collision testing machine. Background technique [0002] With the increasing development and wide application of optoelectronic technology, the optoelectronic industry has entered many fields and has a very important position, which also makes it a high-tech industry that cannot be ignored. However, the research and development and test methods have obvious deficiencies. In order to solve this problem, an optoelectronic collision testing machine is disclosed. Contents of the invention [0003] Aiming at the above technical problems, an optoelectronic collision testing machine comprises a collision testing device, a camera moving up device, a camera rotating device and a camera fine-tuning device. [0004] The crash test device includes a photon input pipeline, a moving rack, and a glass upper cover. The camera moving up device comprises a middle left driven sp...
Claims
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Patent Timeline
Login to View More IPC IPC(8): G01J11/00G01T1/00G01T5/00F16H37/02F16M11/04F16M11/06F16M11/18F16M11/20
Inventor 范聪洁
Owner 江苏锡沂高新材料产业技术研究院有限公司