Reliability analysis method of function-related system

An analysis method and reliable technology, applied in special data processing applications, complex mathematical operations, instruments, etc., can solve problems such as time-consuming, low computing efficiency, waste of computing resources, etc., to reduce evaluation work, improve computing efficiency, The effect of reducing storage

Pending Publication Date: 2021-05-07
JINAN UNIVERSITY
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The combination method avoids the problem of fuzzy calculation results in the simulation method, and there is no state space explosion problem in the Markov method, and it is not limited to components with exponential distribution. diagram, binary decision diagram) wastes computing resources, and it takes a lot of time to repeat work on the BDD that evaluates the fault tree conversion, resulting in low computing efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Reliability analysis method of function-related system
  • Reliability analysis method of function-related system
  • Reliability analysis method of function-related system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051] A case is used to explain the specific implementation process of the proposed method.

[0052] attached figure 2 is a block diagram of a storage subsystem in a computer system that is subject to competing failures PFGE and failure isolation. This memory subsystem consists of an independent memory module (MM) and two memory chips (MC) 1 and MC 2 ), the CPU can access the chip through a memory interface unit (MIU), in other words, the two memory chips are related to the MIU function. When both memory chips work or the independent memory module works, the memory subsystem works. Local failures and propagating failures of elements in this system can be regarded as functionally independent and subject to an exponential distribution, using λ in Table 1 Xl and λ Xp The operating time t is 1000hrs as the local failure rate and the propagation failure rate of the X element. In this example, each element obeys the exponential distribution, but the elements in the proposed ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a reliability analysis method for a function-related system. The method comprises the following steps: replacing an FDEP gate of a fault tree model of the function-related system containing deterministic competition failure with an OR gate; under the condition that competition failure is not considered, performing heuristic sorting on all variables in the static fault tree, and then converting a static fault tree model into a BDD model from bottom to top according to sorted indexes; evaluating the BDD model to obtain a system reliability evaluation formula related to the edge probability; defining events representing different failure sequences of the trigger element and the dependent element, separating competition failures, and calculating the occurrence probability of each event; assigning a value to the edge probability of the BDD model according to the failure condition of the element, and substituting the assigned value into a system reliability evaluation formula to obtain a specific numerical value of the conditional failure probability of the system; and substituting the specific value of the condition failure probability into a total probability formula to obtain the final system reliability. According to the invention, the system reliability can be accurately calculated.

Description

technical field [0001] The invention relates to the field of dynamic system reliability analysis, in particular to a reliability analysis method of a function-related system with deterministic competition failure based on a combination method. Background technique [0002] System reliability refers to the ability of a system to perform normal operating functions within a specified period of time under given environmental and operating conditions. With the advancement of science and technology and the gradual realization of intelligent informatization in various fields of life, system reliability, as an important evaluation indicator, will also face higher requirements and greater challenges in its evaluation and analysis. Accurate analysis and in-depth research on the reliability of computing systems can effectively reduce the losses caused by risk failures, thereby laying a foundation for providing better computing services. [0003] Reliability analysis of dynamic systems...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F17/18G06F119/02
CPCG06F30/20G06F17/18G06F2119/02
Inventor 汪超男刘琼阳官全龙
Owner JINAN UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap