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A kind of integrated circuit simulation method and system

A technology of integrated circuits and simulation methods, applied in the direction of CAD circuit design, special data processing applications, etc., can solve the problems of many circuit simulation times and large scale of simulation precision circuits, so as to improve circuit simulation speed, improve modeling speed, improve Effects of Simulation Accuracy

Active Publication Date: 2022-03-08
宁波巨钻科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a method and system for simulation of integrated circuits to solve the problems in the above-mentioned prior art, so that the problems of simulation accuracy caused by the influence of non-electrical domains on the electrical performance of integrated circuits and the large scale of circuits or the number of times of circuit simulations are relatively small. Simulation speed issues faced by many are resolved

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  • A kind of integrated circuit simulation method and system
  • A kind of integrated circuit simulation method and system
  • A kind of integrated circuit simulation method and system

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Effect test

Embodiment 1

[0088] The invention discloses an integrated circuit simulation method, the specific steps are as follows:

[0089] S1, the integrated circuit includes a non-electrical domain and an electrical domain;

[0090] performing a first simulation based on the non-electrical domain of the integrated circuit, obtaining a first parameter value based on the first simulation, the first parameter value including a first electrical domain parameter value affecting an electrical domain, based on the first simulation an electrical domain parameter value, updating the electrical domain parameter value for the electrical domain of the integrated circuit;

[0091] S2. After updating, perform a second simulation of the electrical domain, obtain a second parameter value based on the second simulation, the second parameter value includes a second non-electrical domain parameter value that affects the non-electrical domain, and based on the first 2. Non-electrical domain parameter values, updating...

Embodiment 2

[0154] like figure 1 , an integrated circuit simulation method, after reading the integrated circuit design, firstly based on the first simulation of the non-electrical domain of the integrated circuit design, and then obtain the parameter values ​​affecting the electrical domain according to the first simulation result, and then for the second simulation Parameter values ​​affecting the electrical domain are updated, finally based on a second simulation of the electrical domain of the integrated circuit design.

[0155] The parameter values ​​affecting the electrical domain obtained through the first simulation of the non-electrical domain are transferred to the second simulation of the electrical domain, so that the second simulation of the electrical domain can be more accurate.

[0156] like figure 2 As shown, an integrated circuit simulation method, on the basis of the aforementioned method, after the second simulation, obtains the parameter value affecting the non-elec...

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Abstract

The invention discloses an integrated circuit simulation method, comprising: S1, performing the first simulation based on the non-electrical domain of the integrated circuit, obtaining the first electrical domain parameter value affecting the electrical domain, and using the first electrical domain parameter value to be the second Simulation updates the parameter values ​​affecting the electrical domain; S2, performing a second simulation to obtain the second non-electrical domain parameter value affecting the non-electrical domain, using the second non-electrical domain parameter value to update the parameter value affecting the non-electrical domain in the first simulation; S3, S1 and S2 are repeated cyclically until the simulation ends. An integrated circuit simulation system, comprising a first simulation module, a first parameter value obtaining module, a second simulation parameter value updating module, a second simulation module, a second parameter value obtaining module, a first simulation parameter value updating module and a cross-domain Simulation scheduling control module. The invention greatly improves the simulation accuracy caused by the influence of the non-electric domain on the electrical performance of the integrated circuit and the simulation speed faced by large circuit scale or many times of circuit simulation.

Description

technical field [0001] The invention relates to the field of integrated circuit design, in particular to an integrated circuit simulation method and system. Background technique [0002] IC simulation is an important step in the IC design process to verify that the design is correct. Simulation accuracy and simulation speed have always been important concerns in IC simulation. [0003] The existing technology focuses on solving the simulation accuracy from the perspective of model accuracy and simulation convergence algorithm. Although the non-electrical factor of temperature is also considered, the circuit simulation is only performed at the same temperature for the entire chip. This simulation is very inaccurate, especially in the chip. In the case of a large difference in temperature distribution. With the advancement of process technology, the size of the feature process continues to shrink, and the performance of devices and physical connections is more and more affec...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/33
CPCG06F30/33
Inventor 吴修衡朱召法胡晓翔
Owner 宁波巨钻科技股份有限公司