Wavelet threshold denoising parameter selection method based on composite evaluation index and wavelet entropy

A wavelet threshold denoising and composite evaluation technology, applied in the field of denoising, can solve problems such as reducing the amount of calculation, and achieve the effect of reducing the amount of calculation and ensuring the effect of denoising

Active Publication Date: 2021-05-28
HARBIN ENG UNIV
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to provide a wavelet threshold denoising parameter selection method based on composite evaluation index and wavelet entropy, whic

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wavelet threshold denoising parameter selection method based on composite evaluation index and wavelet entropy
  • Wavelet threshold denoising parameter selection method based on composite evaluation index and wavelet entropy
  • Wavelet threshold denoising parameter selection method based on composite evaluation index and wavelet entropy

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The present invention is described in more detail below in conjunction with accompanying drawing example:

[0040] combine figure 1 , the present invention provides a kind of wavelet denoising method for adaptively selecting denoising parameters, comprising the following steps:

[0041] Step 1, obtain the backup wavelet base, and obtain the backup wavelet base according to the characteristics of the wavelet base;

[0042] Step 2, wavelet denoising processing, select the maximum number of decomposition layers based on the length of the signal and the length of the backup wavelet base filter, use different backup wavelet bases to decompose the noisy signal layer by layer to the maximum number of decomposition layers, and carry out coefficient refactoring for each decomposition layer According to the structure, multiple groups of denoising signals are obtained, and two traditional indexes of denoising signals are calculated.

[0043] Step 3: Composite evaluation index ca...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention aims to provide a wavelet threshold denoising parameter selection method based on a composite evaluation index and wavelet entropy, which comprises the following steps: acquiring a standby wavelet basis, carrying out wavelet denoising processing, calculating the composite evaluation index, respectively carrying out normalization processing on a data set consisting of two traditional evaluation indexes of different decomposition layers of each wavelet basis, and selecting a wavelet threshold denoising parameter according to the normalization processing. Each wavelet basis obtains a group of composite evaluation indexes, the optimal decomposition layer number is determined, the similar wavelet basis is used for carrying out layer-by-layer wavelet decomposition on a noisy signal to the optimal decomposition layer number, the optimal wavelet basis of each layer of decomposition is determined by calculating the wavelet entropy of a low-frequency coefficient, and the composite evaluation indexes are compared to determine the optimal denoising scheme in the multiple types of wavelet basis. According to the method, the optimal decomposition layer number is determined by constructing the composite evaluation index, and the optimal wavelet basis of each layer of decomposition is determined by calculating the low-frequency coefficient wavelet entropy, so that the optimization problem of two denoising parameters, namely the wavelet basis and the decomposition layer number, in wavelet denoising is solved on the premise that the calculation amount is reduced as much as possible.

Description

technical field [0001] The invention relates to a denoising method, specifically a wavelet threshold denoising method. Background technique [0002] Affected by many factors, observation data is always mixed with a lot of noise information, which brings difficulties to the extraction and identification of signal features. Therefore, signal denoising, which is one of the classic problems in the field of signal processing, is particularly important. The traditional denoising methods mainly include linear filtering and nonlinear filtering. Their disadvantages are that the entropy of the transformed signal increases, the non-stationarity of the signal cannot be described, and the correlation of the signal cannot be obtained. At present, in practical engineering applications, for unsteady signals whose true value is unknown, denoising methods mainly include wavelet denoising, Kalman filter denoising, particle filter denoising and curve threshold denoising, etc. The wavelet denoi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06K9/00G06F17/14G06F17/18
CPCG06F17/148G06F17/18G06F2218/06
Inventor 刘学广谢政宇张巩张二宝闫明谭鉴吴牧云
Owner HARBIN ENG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products