The invention aims to provide a
wavelet threshold denoising parameter
selection method based on a composite evaluation index and
wavelet entropy, which comprises the following steps: acquiring a standby
wavelet basis, carrying out
wavelet denoising processing, calculating the composite evaluation index, respectively carrying out normalization
processing on a
data set consisting of two traditional evaluation indexes of different
decomposition layers of each wavelet basis, and selecting a wavelet threshold denoising parameter according to the normalization
processing. Each wavelet basis obtains a group of composite evaluation indexes, the optimal
decomposition layer number is determined, the similar wavelet basis is used for carrying out layer-by-layer
wavelet decomposition on a noisy
signal to the optimal
decomposition layer number, the optimal wavelet basis of each layer of decomposition is determined by calculating the
wavelet entropy of a low-frequency coefficient, and the composite evaluation indexes are compared to determine the optimal denoising scheme in the multiple types of wavelet basis. According to the method, the optimal decomposition layer number is determined by constructing the composite evaluation index, and the optimal wavelet basis of each layer of decomposition is determined by calculating the low-frequency coefficient
wavelet entropy, so that the
optimization problem of two denoising parameters, namely the wavelet basis and the decomposition layer number, in
wavelet denoising is solved on the premise that the calculation amount is reduced as much as possible.