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High temperature test image heat flow disturbance correction device and method

A test image and correction device technology, applied in image enhancement, image analysis, image data processing, etc., can solve problems such as hot air flow disturbance, uneven ambient temperature distribution, and inability to truly reflect the surface information of the test piece, so as to improve calculation accuracy Effect

Active Publication Date: 2021-09-21
TSINGHUA UNIV
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  • Claims
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Problems solved by technology

[0003] However, during the test process, due to the uneven distribution of ambient temperature, hot air disturbances frequently occur in the test environment, which in turn causes changes in the refractive index of the air, resulting in the collected experimental images not being able to truly reflect the surface information of the specimen, greatly reducing deformation Field Computational Accuracy

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  • High temperature test image heat flow disturbance correction device and method
  • High temperature test image heat flow disturbance correction device and method
  • High temperature test image heat flow disturbance correction device and method

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Embodiment Construction

[0059] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0060] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0061] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

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Abstract

The present disclosure relates to a device and method for correcting heat flow disturbance of a high-temperature test image. The device includes: a heating component, used for heating the test piece; a light emitting component, including a laser emitter, a grid beam expander and a compensation light source; an image acquisition component, used for collecting the first image of the test piece at room temperature and the The second image in the heating state; and the processing component, which is connected with the image acquisition component, and is used to process the image, so as to correct the error caused by heat flow disturbance when obtaining the surface deformation field of the test piece. The embodiments of the present disclosure can improve the calculation accuracy of the deformation field on the surface of the test piece by correcting the heat flow disturbance error of the deformation field on the surface of the test piece.

Description

technical field [0001] The present disclosure relates to the field of engineering material testing, and in particular to a device and method for correcting heat flow disturbances of high-temperature test images. Background technique [0002] In aerospace and other fields, many key structural components need to face the test of high-temperature environment under working conditions. For example, when the aircraft flies at high speed in the atmosphere, the surfaces of the nose cone and flange of the aircraft can reach extremely high temperatures. The development of effective test methods for evaluating the mechanical and thermal properties of high-temperature structural materials plays an indispensable role in the structural design of aircraft and the design of thermal protection materials. In the process of high-temperature material testing, the surface deformation field of the specimen is an important force and thermal performance test index. There are many test methods to o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00G06T7/70
CPCG06T7/70G06T5/80
Inventor 冯雪王锦阳张金松唐云龙岳孟坤
Owner TSINGHUA UNIV
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