Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Capacitor network mismatch correction method and device

A capacitance network and correction method technology, which is applied in the direction of analog/digital conversion calibration/testing, etc., can solve problems such as difficulty in manufacturing capacitors, increasing process costs, increasing layout design complexity, etc., and achieves the effect of improving accuracy and low cost

Active Publication Date: 2021-07-13
BEIHANG UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, technology (1) has the following problems: the use of laser trimming requires additional process costs
[0007] Technology (2) has the following problems: the complexity of the layout design is increased, and due to the limitation of manufacturing accuracy, it is difficult to manufacture very small capacitors to make up for the error (the standard deviation of the capacitor in the COMS process is generally below 1%)
[0008] Technology (3) has the following problems: an additional DAC needs to be added to the circuit design to compensate for errors caused by capacitance mismatch
This results in a DAC requiring very high precision, which is difficult to achieve

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitor network mismatch correction method and device
  • Capacitor network mismatch correction method and device
  • Capacitor network mismatch correction method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0030] Since it is difficult to test the capacitance value of the SAR ADC after the manufacture is completed, and the current technology for improving the accuracy of the ADC has problems such as high cost and complicated manufacturing process, based on this, the embodiment of the present invention proposes a method that can correct the capacitance...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a capacitor network mismatch correction method and device, and the method comprises the steps: 1, obtaining an ideal threshold voltage of a predetermined digital code of an ADC to be corrected according to a predetermined rule; 2, arranging a plurality of capacitors corresponding to the predetermined digital code so as to minimize the error between the threshold voltage of the predetermined digital code and the ideal threshold voltage; 3, executing the step 1 and the step 2 on each digital code in the ADC to be corrected according to the sequence from the high-order digital code to the low-order digital code so as to correct the mismatch of the capacitor network of the ADC to be corrected. According to the invention, the capacitor network mismatch of the ADC can be corrected, so that the precision of the ADC can be improved.

Description

technical field [0001] The invention relates to the field of analog-to-digital converter design, in particular to a correction method and device for capacitance network mismatch. Background technique [0002] In the design of SAR ADC (Successive Approximation Register Analog-to-Digital Converter, successive comparison analog-to-digital converter), the matching degree of the capacitor voltage divider network will largely affect the accuracy of the ADC. However, the errors generated during the chip manufacturing process are difficult to avoid, and the capacitance value is difficult to measure after the manufacturing is completed. At present, the following technologies are mainly used to improve the accuracy of ADC: [0003] (1) Use laser trimming technology to make the matching of weight capacitor or weight resistance network better. [0004] (2) In the layout design, in addition to designing the unit capacitor, design many small capacitors or resistors near the unit capacit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/10
Inventor 胡远奇吕严谨
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products