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Direct current aging test device

An aging test, direct current technology, applied in the direction of measuring device, measuring power, test circuit, etc., can solve the problem of power failure of the main power supply, affecting the operation status of other branches, etc., to achieve the effect of automatic measurement

Pending Publication Date: 2021-07-16
STATE GRID HEILONGJIANG ELECTRIC POWER CO LTD ELECTRIC POWER RES INST +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the total power supply must be cut off when the breakdown branch is removed during the electrical aging test of the existing solid dielectric, which affects the operating status of other branches. The present invention provides a DC aging Test device

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Embodiment Construction

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0027] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0028] see figure 1 Illustrate this embodiment, the DC aging test device described in this embodiment includes a high-voltage DC power supply 1, a control circuit 2, a fiber grating demodulator 3, a sampling circuit 4, a protection resistor R1 and N test circuits 5; N is greater than or an integ...

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Abstract

A direct current aging test device belongs to the field of insulation material aging evaluation. The problem that the operation states of other branches are affected due to the fact that a main power supply must be powered off when a breakdown branch is removed in the electrical aging test process of an existing solid dielectric is solved. A high-voltage direct-current power supply supplies power to N test circuits through a protective resistor R1, and each test circuit is used for providing high voltage for a tested sample, monitoring the breakdown state of the tested sample and sending a monitoring result to a fiber grating demodulator; the fiber bragg grating demodulator demodulates the monitoring result output by each test circuit to obtain a demodulation result; the control circuit is used for judging whether the tested sample in the test circuit corresponding to the demodulation result is broken down or not according to the received demodulation result; and when it is determined that the sample is broken down, power supply of the test circuit where the tested sample is located is cut off. The direct current aging test device is mainly used for aging tests of insulating materials.

Description

technical field [0001] The invention relates to the field of aging evaluation of insulating materials. Background technique [0002] Under the action of a strong electric field, the process in which a solid dielectric loses its electrical insulation ability and changes from an insulating state to a good conductive state is called breakdown. In a uniform electric field, the ratio of the breakdown voltage to the thickness of the solid dielectric is called the breakdown field strength, also known as the dielectric strength, which reflects the dielectric strength of the solid dielectric itself. The breakdown field strength of the solid dielectric is a function of time. The longer the pressurization time, the lower the breakdown field strength of the insulation. Through the electrical aging test, the functional relationship between the breakdown field strength of the solid dielectric and time can be tested. Only by obtaining This functional relationship enables a more reasonable...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/12G01R31/14G01R31/00
CPCG01R31/1263G01R31/003G01R31/14
Inventor 李琳刘贺千孔繁荣梁建权王悦张健陈孟杨
Owner STATE GRID HEILONGJIANG ELECTRIC POWER CO LTD ELECTRIC POWER RES INST