Supercharge Your Innovation With Domain-Expert AI Agents!

Warming-up method for semiconductor technology equipment and semiconductor technology equipment

A process equipment and semiconductor technology, applied in semiconductor/solid-state device manufacturing, computer components, collaborative devices, etc., can solve the problems of inability to reduce costs, long chamber recovery period, waste of labor costs, etc., and achieve production and operation. The effect of cost reduction, material cost reduction, and time cost reduction

Pending Publication Date: 2021-07-23
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the recovery process after the regular maintenance of the existing process chamber, in order to reach the preset number of warm-up processes, either a sufficient amount of warm-up wafers are placed in the wafer cassette, and the warm-up is completed through a warm-up process task. In this way, each warm-up chip is only processed once, which makes the warm-up cost higher, or an insufficient amount of warm-up chips are placed in the wafer box, and the warm-up is completed through multiple warm-up process tasks. This method requires multiple loading - In the process of operation-unloading, the recovery period of the chamber is longer, which wastes labor costs to a certain extent
Existing warm-up methods cannot meet the requirements of rapid recovery chamber while reducing costs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Warming-up method for semiconductor technology equipment and semiconductor technology equipment
  • Warming-up method for semiconductor technology equipment and semiconductor technology equipment
  • Warming-up method for semiconductor technology equipment and semiconductor technology equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present application is described in detail below, and examples of embodiments of the present application are shown in the drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. Also, detailed descriptions of known technologies will be omitted if they are not necessary to illustrate the features of the present application. The embodiments described below by referring to the figures are exemplary only for explaining the present application, and are not construed as limiting the present application.

[0037] Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings as commonly understood by those of ordinary skill in the art to which this application belongs. It should also be understood that terms, such as those defined in commonly used dictionaries, should be ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a warming-up method for semiconductor technology equipment and the semiconductor technology equipment. The method comprises the steps of: determining an identifier of a warming-up wafer box loaded on the semiconductor technology equipment and the distribution information of warming-up wafers in the warming-up wafer box, and transmitting the identifier and the distribution information to a control end to enable the control end to verify the identifier and the distribution information in sequence; and after the identifier and the distribution information passes verification, executing a circulating warming-up process on at least part of the warming-up wafers according to a circulating process instruction sent by the control end. By applying the method, the overall operation time and the production operation cost of the circulating heating process can be reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a warm-up method for semiconductor process equipment and the semiconductor process equipment. Background technique [0002] In the daily production of wafers, the control terminal equipment of the factory generally interacts with the semiconductor process equipment in accordance with the message format defined by the SEMI standard, and sends instructions to the semiconductor process equipment. The semiconductor process equipment specifies the carrier (wafer box), Wafer (wafer) and recipe (process formula) are used to carry out specific automatic operation processes, so as to transfer the wafer (wafer) to the designated chamber for process processing. Generally, after the wafer box (Foup) is delivered to the machine, the semiconductor process equipment will automatically operate according to the sequence of loading, process, and unloading. [0003] After the p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/67G06K17/00
CPCH01L21/67294H01L21/67011G06K17/0029
Inventor 刘振华
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More