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NAND drive program test system and method

A driver and test system technology, applied in the field of NAND test, can solve problems such as difficulties in the development and maintenance of synchronous hybrid test systems, and achieve the effect of improving development efficiency and maintainability with obvious advantages

Pending Publication Date: 2021-08-13
SHANDONG SINOCHIP SEMICON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at the defects of the prior art, the present invention provides a NAND driver test system and method, which solves the problem of difficult development and maintenance of multi-type test command synchronous hybrid test system through modular design combined with CPU time-division multiplexing scheduling technology

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Embodiment 1

[0048] This embodiment discloses a NAND driver testing system. This system encapsulates the functions required for various tests into modules. Each module can independently occupy CPU resources in turn under the management of the scheduler. Simulate parallel operation, combine different configurations of modules and reasonable connections between modules, so as to meet the functional and performance testing requirements of NAND drivers in various scenarios.

[0049] Such as figure 1 As shown, the test system includes a test management module, an information statistics module, a data processing module, a command generation module, a feedback information analysis module, a NAND driver interface module, a resource management module and a scheduling module. During the entire test process, the test management module is responsible for monitoring the entire test process and handling exceptions. The scheduling module is responsible for reasonably allocating CPU resources to each modu...

Embodiment 2

[0072] This embodiment discloses a method for testing NAND driven reservoir sequence, such as figure 2 shown, including the following steps:

[0073] 1. At the beginning of the test, allocate an independent stack space for each module as described above, as well as the initial priority required for scheduling, and then start the test management module;

[0074] 2. The test management module sends configuration information to the information statistics module to determine the type of command to be sent and the quantity of each command;

[0075] 3. Start a certain type of command generation module to enter the command generation process. This module will first query the resource management module to check whether the system can allocate its corresponding resources, such as whether there is an available command ID number, or whether there is a slave The memory space of a large amount of data returned by the driver, etc.; if such resources can be obtained, go to step 4, otherwis...

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Abstract

The invention discloses an NAND drive program test system and method, a drive test function is divided into different modules, through cutting and function multiplexing of the modules and time division multiplexing of the modules to a CPU, the multi-task synchronous test requirements under different scenes are met, and the development efficiency and maintainability are improved. According to the invention, only different command sending and processing modules need to be set for different mixing types, and basic requirements such as a test process and resource use can be effectively monitored through the management module. The CPU time division multiplexing scheduling technology of the modules provides a universal method for scheduling the modules, and the scheduler can allocate the CPUs to the modules in sequence according to preset requirements, so that the uncertainty and debugging difficulty caused by calling the modules by using simple branches and loop codes are avoided, and the proportion of different types of test commands can be adjusted only by modifying the priority, so that reliability and high efficiency are achieved.

Description

technical field [0001] The invention relates to the field of NAND testing, in particular to a NAND driver testing system and method. Background technique [0002] At present, there are problems in the development and maintenance of multi-type test command synchronous hybrid test system. When traditional methods face this kind of test problem, it is generally necessary to compile independent test codes for each type of command. When testing mixed command types, these codes are rearranged and blended into a new use case. This process It is often accompanied by a large number of interface modifications, data processing sequence adjustments, etc.; and when the mixed type is changed, the above work needs to be done again. [0003] Even if the traditional method uses modular design in the design stage, when multiple types of commands are mixed and sent, the module call implemented only through simple branches, loops, etc. often cannot meet complex data processing, and often requi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F9/50
CPCG06F11/3688G06F9/5038G06F2209/5021
Inventor 唐汉钊
Owner SHANDONG SINOCHIP SEMICON