Precision testing device for current-carrying friction pair of conductive slip ring of satellite

Abstract

A precision testing device for a current-carrying friction pair of a conductive slip ring of a satellite disclosed by the present invention comprises at least one group of testing assemblies, each group of testing assemblies comprises an upper sample loading measurement mechanism and a lower sample detachable positioning mechanism, and the lower sample detachable positioning mechanism comprises a lower sample positioning support block and a lower sample positioning fixing block. The lower sample positioning fixing block and the lower sample positioning supporting block are circumferentially positioned through a lower sample positioning structure; a lower sample reciprocating swing driving mechanism drives the lower sample to swing back and forth in the circumferential direction; and the upper sample loading measurement mechanism comprises an upper sample clamp, an upper sample positioning and supporting block, an upper sample positioning and fixing block and a shear stress sensor group, an upper sample is driven to move through an upper sample displacement loading module, and the magnitude of force borne by the upper sample is detected through the shear stress sensor group. The device disclosed by the invention has the advantages that the position consistency of the sample after being disassembled and reassembled is ensured, and the circumferential reciprocating swing of the lower sample can be realized.

Description

technical field [0001] The invention relates to the technical field of experimental equipment, in particular to a precision testing device for a current-carrying friction pair of a satellite conductive slip ring. Background technique [0002] The conductive slip ring is mainly composed of slip ring and brush wire. The surface of the slip ring is processed with V-shaped grooves, and the surface is treated with multi-layer precious metal plating. The brush wire is made of gold alloy wire. The conductive slip ring transmits current through the sliding contact between the brush wire and the V-shaped groove of the slip ring. As a key component in the satellite, the conductive slip ring usually requires a maintenance-free working life of more than 10 million revolutions, which puts forward high requirements for ground testing. However, in long-term actual work, the conductive slip ring will experience unexpected additional wear and unstable contact resistance in the electrical co...

AI Technical Summary

Problems solved by technology

However, in long-term actual work, the conductive slip ring will experience unexpected additional wear and unstable contact resistance in the state of electrical contact, which seriously affects its performance and service life.

[0003] Existing experimental testing devices for conductive slip rings have the following defects, so they cannot meet the current-carrying wear test:

[0004] 1. Most of the existing conductive slip ring testing machines adopt the one-way rotation method, and there is no experimental device for the type of circular reciprocating swing motion, that is, the motion between the brush wire and the slip ring is one-way rotation. For the reciprocating circular swing motion The slip ring in this way cannot carry out continuous and stable experiments and data measurement

[0005] 2. The installation of the sample adopts the traditional clamping method, which cannot maintain the consistency of the position when the sample is disassembled and then reinstalled. For the long-term experimental period, when the wear condition of the slip ring needs to be characterized, there will be disassembly The sample cannot be installed in situ, which affects the follow-up experiment and is not conducive to the interrupted characterization in the experiment

[0006] 3. The number of experimental tests can only be measured at a single station, and the number of measurements at the same time is small. Under multi-factor experiments, it is impossible to obtain sufficient data and comparative experiments, which is not conducive to long-term experiments and low experimental efficiency.

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