Method and device for predicting major occurrence of potato late blight, equipment and storage medium

A potato late blight, potato technology, applied in forecasting, instrumentation, data processing applications, etc., can solve problems such as inability to effectively prevent potato late blight

Pending Publication Date: 2021-09-10
张斌 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Using the above method to carry out corresponding antibacterial treatment on the seeds at the initial stage of planting can have a significant effect on the prevent...

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  • Method and device for predicting major occurrence of potato late blight, equipment and storage medium
  • Method and device for predicting major occurrence of potato late blight, equipment and storage medium
  • Method and device for predicting major occurrence of potato late blight, equipment and storage medium

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Embodiment Construction

[0039] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0040] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0041] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

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Abstract

The invention relates to a potato late blight occurrence prediction method, which comprises the following steps: collecting meteorological factor data of a potato planting region every day from the emergence time of a first plant, and generating a potato infection curve by adopting an early warning model based on the collected meteorological factor data; when it is monitored that the climate of the potato planting region is humid within a preset time period from the day when the potato center diseased plant appears, the initial time when the climate of the potato planting region enters the humid period is obtained; counting the number of extremely severe infection curves and the number of severe infection curves from the day of the first potato infection curve generated to the initial time, and summing the number of the extremely severe infection curves and the number of the severe infection curves to obtain a corresponding first number; and obtaining a prediction result whether the potato late blight has a large occurrence trend according to the first number.

Description

technical field [0001] The present disclosure relates to the technical field of monitoring potato late blight, in particular to a method, device, equipment and storage medium for predicting large-scale occurrence of potato late blight. Background technique [0002] Potato Late Blight (Potato Late Blight) is caused by Phytophthora infestans, causing death of potato stems and leaves and tuber rot. The pathogen of potato late blight mainly overwinters in potato cubes with mycelium. After sowing infected potato cubes, it causes no germination or dies immediately after germination. Some will become central diseased plants after being unearthed, and the sporangia produced by the diseased part will be re-infected by airflow transmission, and the disease center will be formed, causing the disease to spread rapidly from point to surface; With rain or irrigation water, it can penetrate into the soil and infect the tubers to form diseased tubers. It can be seen that potato late bligh...

Claims

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Application Information

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IPC IPC(8): G06Q10/04G06Q50/02
CPCG06Q10/04G06Q50/02Y02A90/10
Inventor 张斌谈孝凤耿坤王姝玮张君
Owner 张斌
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