Three-temperature test system and control method

A technology of a test system and control method, applied in electronic circuit testing, integrated circuit testing, measuring electricity and other directions, can solve the problems of high labor cost, time-consuming and laborious, and achieve fast and convenient process, meet the requirements of chip testing, and meet the requirements of rapid testing. Effect

Inactive Publication Date: 2021-09-24
XTX TECH INC
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Problems solved by technology

[0004] The purpose of the present invention is to provide a three-temperature test system and control method, aiming to solve the problem that the existing three-temperature test needs to manually switch the temperature and start the test. The problem

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[0031] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of the present application.

[0032] It should ...

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Abstract

The invention discloses a three-temperature test system and a control method, a control module sends a temperature switching instruction to a heat flow module, the heat flow module can realize automatic temperature switching, the whole temperature switching and chip test process can be automatically realized until the test is completed only by inputting a test starting instruction, the whole process is rapid and convenient, manual follow-up and processing are not needed in the process, so that the testing speed is greatly improved, time and labor are saved, and the labor cost is reduced; the heat flow module adopts a heat flow cover, so that rapid high-low temperature circulation switching can be provided, and the requirement of rapid testing is met; and a Magnum2 testing system is arranged in the testing machine, comprehensive function detection can be carried out on the chip, and the chip testing requirement is met.

Description

technical field [0001] The invention relates to the technical field of chip reliability testing, in particular to a three-temperature testing system and a control method. Background technique [0002] Chips are known as the food of industry and the core of manufacturing, and all industries cannot do without chips. Due to the difference in the chip application environment, the reliability test of the chip is very necessary. The three-temperature test of the chip refers to the functional test of the chip at three temperatures: high temperature, normal temperature, and low temperature. The traditional method of chip three-temperature test is as follows: 1. Set a temperature on the heat flow device; 2. Start the test program test after the temperature of the heat flow device is stable; 3. Set another temperature after the test; 4. After the temperature is stable Then start the test program test; in this way, the temperature test is performed. However, the traditional method h...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2875G01R31/287
Inventor 潘雷唐维强
Owner XTX TECH INC
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