Integrated testing device of probe detection tool and working method thereof
A technology of probe detection and integrated testing, which is applied in the direction of measuring devices, electronic circuit testing, and components of electrical measuring instruments, etc., can solve the problems of cumbersome handover process, slow flow process, high cost, etc., to improve detection efficiency and reduce Detection cost, effect of facilitating summary analysis
Pending Publication Date: 2021-10-19
苏州奥金斯电子有限公司
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Problems solved by technology
At present, most of the quality inspections of tooling are carried out by professional testing agencies. The high cost, cumbersome handover process and slow transfer process have become the serious problems in the field of tooling quality inspection.
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[0025] The technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0026] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "upper", "lower", "front", "rear", "left", "right", " The orientations or positional relationships indicated by "vertical", "horizontal", "top", "bottom", "inner", "outer", "axial", "radial", and "circumferential" are based on the drawings The orientation or positional relationship shown is only for the convenience of describing the present invention and simplifying the description, but does not indicate or impl...
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The invention discloses an integrated testing device of a probe detection tool and a working method thereof. The integrated testing device comprises a detection mechanism and a master control terminal, and the detection mechanism comprises a mechanical part fatigue detection assembly and a probe performance testing assembly; the mechanical part fatigue testing assembly comprises a tool mounting seat and a reciprocating pressurizing mechanism matched with the tool mounting seat, and the reciprocating pressurizing mechanism comprises a pressurizing workpiece erected on the tool mounting seat and a numerical control reciprocating driving device connected to the pressurizing workpiece; the probe performance testing assembly comprises a probe electrical performance testing assembly, the probe electrical performance testing assembly comprises a tool clamp and an electrical performance testing module erected on the tool clamp, and the electrical performance testing module comprises a numerical control lifting abutting probe erected above the tool clamp and a conduction loop matched with the lifting abutting probe. The device has the advantages that the detection equipment is miniaturized, the detection process is integrated, the detection efficiency is effectively improved, and the detection cost is reduced.
Description
technical field [0001] The invention relates to the field of probe detection and processing, in particular to an integrated test device for probe detection tooling and a working method thereof. Background technique [0002] A series of modern technologies after the second industrial revolution are based on the integrated circuit and chip technology. With the development of modern technology, whether it is the digital terminal of computers and mobile phones or the civilian machinery and equipment such as automobiles and home appliances, The evolution of its performance needs to rely on the progress of basic chip technology. Based on this factor, in the contemporary industry, the demand for chips is rising exponentially, and with it, the demand for the chip testing industry necessary for chip production is also rising. In the chip detection operation, the most basic and indispensable workpiece is the chip probe detection tool. In order to ensure the smooth progress of chip de...
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IPC IPC(8): G01R1/067G01R31/28
CPCG01R1/067G01R31/2884
Inventor 裴悠松朴文杰
Owner 苏州奥金斯电子有限公司