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Sample frame grabbing method, device and system

A sample rack and gripper technology, which is applied in the field of medical devices, can solve the problems of high labor intensity of operators, inability to judge abnormal situations, operators can deal with them immediately, and low intelligence of assembly line system, so as to achieve the effect of improving intelligence

Active Publication Date: 2021-10-22
ZHUHAI LIVZON DIAGNOSTICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, as long as there is an abnormal situation in the existing assembly line system, an alarm will be sent to notify the operator to deal with it as soon as possible, and it cannot be judged whether the abnormal situation needs to be dealt with immediately by the operator
Therefore, alarms will be issued for some abnormal situations that do not need to be dealt with immediately, causing operators to frequently deal with abnormal situations that do not need to be dealt with immediately. The labor intensity of operators is high, and the intelligence of the assembly line system is low.

Method used

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  • Sample frame grabbing method, device and system
  • Sample frame grabbing method, device and system
  • Sample frame grabbing method, device and system

Examples

Experimental program
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Embodiment 1

[0037]An embodiment of the present invention provides a sample rack grabbing method, which is applied to the control unit of the sample rack grabbing system. The sample rack grabbing system includes a gripper for grabbing the sample rack; see figure 1 A flow chart of a method for grabbing a sample rack is shown, and the method for grabbing a sample rack includes the following steps:

[0038] Step S102, initialize the gripper, so that the gripper returns to a preset initial position and is in an open state.

[0039] The control unit of the sample rack grabbing system may be a unit with a data processing function such as a CPU (Central Processing Unit, central processing unit) or an MCU (Microcontroller Unit, micro control unit). The gripper mentioned above is the grabbing device, and the sample rack can be grabbed from the assembly line system through the gripper. The preset position is the position of the gripper before performing the grabbing operation, and the position is g...

Embodiment 2

[0050] This embodiment provides another sample rack grasping method, which is implemented on the basis of the above embodiments; this embodiment focuses on the specific implementation after the grabbing operation grabs the sample rack. see figure 2 The flow chart of another sample rack grabbing method is shown, the sample rack grabbing method in this embodiment includes the following steps:

[0051] Step S202 , control the gripper to complete the gripping operation, and obtain clamping information and the number of first steps taken by the gripper to complete the gripping operation; wherein, the gripping information indicates that the gripping operation grabs the sample rack.

[0052] The above step S202 includes the above steps S102, S104, S106 and S108. First, the structure of the sample rack grabbing system in the assembly line system is described. See image 3 A schematic diagram of a sample rack grabbing system at the beginning of an assembly line is shown, including a ...

Embodiment 3

[0082] Corresponding to the above method embodiments, an embodiment of the present invention provides a sample rack grabbing device, which is applied to a control unit of a sample rack grabbing system. The sample rack grabbing system includes a gripper for grabbing a sample rack. like Figure 10 A structural schematic diagram of a sample rack grabbing device shown, the sample rack grabbing device includes:

[0083] The gripper initialization module 1001 is used to initialize the gripper so that the gripper returns to a preset initial position and is in an open state;

[0084] The stepping motor control module 1002 is used to control the stepping motor of the gripper to drive the gripper to complete the grabbing operation;

[0085] A current value sampling module 1003, configured to sample the current value of the stepper motor based on a preset time interval, and determine whether the current value exceeds a preset first threshold;

[0086] The clamping information acquisiti...

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PUM

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Abstract

The invention provides a sample frame grabbing method, device and system. The sample frame grabbing method comprises the steps that a gripper is initialized, so that the gripper returns to a preset initial position and is in an open state; a stepping motor of the gripper is controlled to drive the gripper to complete gripping operation; the current value of the stepping motor is sampled based on a preset time interval, and whether the current value exceeds a preset first threshold value or not is judged; if yes, the clamping information and the first step number of grabbing operation completed by the gripper are obtained; the clamping information represents that a sample frame is grabbed by the grabbing operation; if not, empty clamping information and the first step number of grabbing operation completed by the gripper are obtained; and the empty clamping information represents that the sample frame is not grabbed in the grabbing operation. According to the sample frame grabbing method, whether the sample frame is grabbed in the grabbing operation or not can be accurately judged according to the sampled current value, so that the intelligent degree of the sample frame grabbing system is improved.

Description

technical field [0001] The present invention relates to the technical field of medical instruments, in particular to a sample rack grabbing method, device and system. Background technique [0002] The assembly line in the in vitro diagnostic industry refers to the organic combination of multiple analytical equipment to realize the automatic distribution and analysis of the samples to be tested. The analytical equipment can be biochemical analyzers, blood cell analyzers, immune analyzers, and multiple liquid phase analyzers. , through automatic allocation and analysis, the test efficiency of samples can be greatly improved. [0003] In the existing assembly line system, when the sample is at the starting position, the sample rack needs to be grabbed by the grabbing device and placed in the guide rail of the assembly line system, and the sample rack is transported to the designated analysis equipment through the guide rail for the analysis of the sample to be tested. For test...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B25J9/16
CPCB25J9/1602Y02P90/02
Inventor 张冠群柳邦源黄权敏贺旭林黄伟任
Owner ZHUHAI LIVZON DIAGNOSTICS