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Method for determining a correction value function and method for generating a frequency-corrected hyperspectral image

A technology of correction amount and spectrum, which is applied in the field of hyperspectral images and can solve problems such as inability to correct sensor components

Active Publication Date: 2021-10-22
BRUKER OPTICS GMBH & CO KG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this does not allow an exact correction of all sensor elements

Method used

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  • Method for determining a correction value function and method for generating a frequency-corrected hyperspectral image
  • Method for determining a correction value function and method for generating a frequency-corrected hyperspectral image
  • Method for determining a correction value function and method for generating a frequency-corrected hyperspectral image

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Embodiment Construction

[0069] figure 1 FTIR microscopy in a reflection arrangement is shown. Infrared light from an IR source 1 is captured by a mirror 2 , collimated and deflected into a (modified) Michelson interferometer 3 . Here the light hits the beam splitter 3a, which transmits a part of the radiation and allows it to the fixed mirror 3b, reflects another part of the radiation and deflects it to the movable mirror 3c. The light reflected on mirrors 3 b and 3 c is then superimposed again at beam splitter 3 a and leaves interferometer 3 . The infrared light modulated by interferometer 3 exits interferometer 3 and is directed into microscope optics 4 . There it is deflected via various mirrors 4 a to a beam splitter or half mirror 4 b and from there into an objective 4 d (condenser mirror), which illuminates the microscopic sample at the sample position 5 . The sample at sample position 5 interacts with the modulated infrared radiation and reflects a portion of the radiation. The reflected r...

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Abstract

The invention relates to a method for determining a correction value function kF(x, y) for calibrating an FTIR measuring assembly having an IR detector, the IR detector comprising a plurality of sensor elements, which are located at respective positions (x, y), the method comprising the following steps: e) capturing interferograms IFGRXY of a reference sample using the sensor elements of the IR detector; f) calculating spectra Rxy of the reference sample using a Fourier transform of the interferograms of the reference sample for at least four sensor elements; g) calculating correction values kxy by comparing each spectrum Rxy of the reference sample calculated in step b) with a comparison data set for the reference sample; and h) determining the correction value function kF(x, y) using the correction values kxy calculated in step c). By means of the method according to the invention, frequency shifts that occur in the case of FTIR spectrometers with extensive detectors can be effectively corrected regardless of the position of the sensor element.

Description

technical field [0001] The invention relates to a method for ascertaining a correction variable function for calibrating an FTIR measuring device with an IR detector. The FTIR measurement setup also comprises an IR source, an interferometer and a sample position, wherein the light of the IR source passes through the interferometer and after leaving the interferometer is deflected to a sample position which is in the focus of the imaging optics. The sample position is imaged onto the detector. [0002] The invention also relates to a method for generating a frequency-corrected hyperspectral image of a sample by means of an FTIR measuring device with an IR detector. Background technique [0003] A method for ascertaining a correction variable for calibrating an FTIR spectrometer is known from [3]. [0004] Imaging FTIR microscopy enables spatially resolved spectral measurements of microscopic samples while simultaneously recording infrared spectra at different locations on t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/35G01N21/27
CPCG01N2021/3595G01N21/274G01N21/35G01N2021/1772G01J3/45G01J2003/4534G01J3/0208G01J3/021G01J3/0243G01J5/80G01J5/10G01J2005/0077
Inventor R·哈里格S·吕特约翰
Owner BRUKER OPTICS GMBH & CO KG