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Test fixture, test device and test method for batch test of detectors

A test fixture and batch test technology, applied in the field of detectors, can solve problems such as low test efficiency, difficult test data management, difficult detector placement, etc., to improve test efficiency, avoid repeated adjustments, facilitate online management and The effect of product traceability

Pending Publication Date: 2021-11-02
SHANGHAI IRAY TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a test fixture, a test device and a test method for batch testing of detectors, which are used to solve the difficulties in placement of detectors and the test efficiency in the prior art. Low, difficult test data management and other issues

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  • Test fixture, test device and test method for batch test of detectors
  • Test fixture, test device and test method for batch test of detectors
  • Test fixture, test device and test method for batch test of detectors

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Embodiment Construction

[0041] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0042] For example, when describing the embodiments of the present invention in detail, for the convenience of explanation, the cross-sectional view showing the device structure will not be partially enlarged according to the general scale, and the schematic diagram is only an example, which should not limit the protection scope of the present invention. In addition, the three-dimensional space dimensions of length, width and depth sho...

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Abstract

The invention provides a test fixture, a test device and a test method for batch test of detectors. A box body of the test fixture comprises a tungsten sheet placing groove and a detector placing groove which are sequentially arranged from top to bottom, and a plurality of detector placing grooves can be sleeved at the same time in the vertical direction so as to be compatible with various detectors with different specifications and sizes. And the detector placing groove only needs to be contacted with the peripheral edge of the detector and provide supporting force, so the problem of uneven placement caused by contact with an irregular back shell of the detector is avoided. And the tungsten sheet placing groove is convenient for a tester to place the tungsten sheet in a standard manner, so the problems of repeated adjustment caused by an improper deviation angle, interference of artifacts left after the tungsten sheet is adjusted on a test result and the like are solved. According to the testing device, a plurality of detectors can be tested in batches at the same time, the testing efficiency is greatly improved, in addition, the testing results of all the detectors can be automatically collected, and the testing results can be conveniently imported into an MES system for online management and product tracing.

Description

technical field [0001] The invention relates to the field of detectors, in particular to a test fixture, a test device and a test method for batch testing of detectors. Background technique [0002] For small-sized X-ray detectors (such as intraoral detectors used to take pictures of teeth in the oral cavity), the light-receiving surface is usually flat, while the back shell is an irregular curved shape, and ordinary placement cannot ensure that the detector is placed flat , it is difficult to guarantee the accuracy and consistency of performance testing when carrying out factory inspection (OQC). Especially for the MTF test, there are higher precision requirements (MTF is the modulation transfer function, which is defined as the ratio between the contrast or modulation degree of the output image and the contrast or modulation degree of the input image, and is a comprehensive reflection of the spatial resolution and contrast sensitivity of the detector. ). At present, the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A61B6/00A61B6/03
CPCA61B6/58A61B6/032
Inventor 袁钰函唐望升张楠
Owner SHANGHAI IRAY TECH