Pollution source searching method based on defective products in semiconductor production line
A semiconductor and production line technology, applied in the field of pollution source search, to achieve the effect of reducing the number of screening, high efficiency and low cost
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Embodiment 1
[0059] see Figure 1~4 As shown, a method for finding pollution sources based on defective products in a semiconductor production line. The semiconductor production line is located in a clean room to be monitored. The semiconductor production line includes 1200 processes, and the yield rate of semiconductor products is tested every 5 processes. ; including the following steps:
[0060] (1) When a defect in a semiconductor product is detected in a certain yield inspection process, first determine whether the cause of the defect is caused by the machine associated with the defective product or the environment. If the former is the case, the machine will be repaired. If the latter, proceed to the next step;
[0061] (2) Determine the species of pollutants; use SEM, EDS and FIB to determine the species of pollutants;
[0062] (3) Investigate the machines in the clean room space to be monitored, and exclude machines that do not produce the pollutant species involved in the step (...
Embodiment 2
[0073] A method for finding pollution sources based on defective products in a semiconductor production line, the steps of which are the same as in Embodiment 1, the only difference being that in step (5), a movable sampling device is used to separate the sources of pollutants after the previous steps are eliminated Further sampling, followed by further testing, can determine the source of the contaminant.
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