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High-resolution-high-precision stokes-mueller imager and its calibration method

A calibration method and imager technology, which is applied in the direction of instrumentation, optical instrument testing, machine/structural component testing, etc., can solve problems such as inconsistent optical paths and different polarization characteristics, so as to improve accuracy, reduce process requirements, and eliminate large-angle light leakage Effect

Active Publication Date: 2022-07-05
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Application Information

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Problems solved by technology

However, for the objective lens whose working distance is lower than the difference between the thickness of the calibration element and the thickness of the slide glass, the calibration element needs to be placed in the optical path, and the objective lens needs to be moved, resulting in the inconsistency of the optical path between calibration and actual measurement. Through polarization analysis After the light angle of the instrument changes, its polarization characteristics will also be different, and the instrument matrix obtained by calibration is not the instrument matrix in actual measurement.

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  • High-resolution-high-precision stokes-mueller imager and its calibration method
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  • High-resolution-high-precision stokes-mueller imager and its calibration method

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Embodiment Construction

[0026] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0027] It is noted that various aspects of embodiments within the scope of the appended claims are described below. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and / or function described herein is illustrative only. Based on this disclosure, those skilled in the art should appreciate that an aspect described herein may be implemented independently of any other aspects and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and / or a method may be practiced using any number of the aspects set forth herein. Additionally, such an apparatus may be implemented and / or such a method may be practiced using other structure and / or functionality in addition to one or more of the aspects set forth herein.

[0028] The...

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Abstract

The present invention provides a high-resolution-high-precision Mueller imager and a calibration method thereof, wherein the polarization state generator of the imager includes a polarizer P1 and a wave plate R1 rotatable around the optical axis in a plane perpendicular to the optical axis; the polarizer P1 is composed of Two Glan-laser prisms are combined. The transmission axes of the two Glan-laser prisms in the polarizer P1 are coincident, but the orientations of the reflecting surfaces are opposite; the polarization state analyzer of the imager includes the polarizer P2 and a Waveplate R2 that can be rotated around the optical axis in the axial plane; the polarizer P2 is composed of two Glan-laser prisms, and the light transmission axes of the two Glan-laser prisms in the polarizer P2 are coincident, but the reflection surface The orientation is opposite.

Description

technical field [0001] The invention belongs to the technical field of imaging system design and calibration, and particularly relates to a high-resolution-high-precision Mueller imager and a calibration method thereof. Background technique [0002] The Stokes-Mueller imager can obtain the Stokes vector of the polarized light and the Mueller matrix of the measured target. The Mueller matrix contains all the polarization information of the target and reflects the structural information of the target. The use of Stokes-Mueller imagers to observe the structure of various samples is widely used in various fields. Reasonable design and accurate calibration of the system are of great significance for obtaining more accurate Stokes vector and Mueller matrix of the target and improving the measurement accuracy of the instrument. [0003] Polarizers using the principle of total reflection, such as Glan prisms, have their field of view limited to a certain range due to limitations in...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/21G01M11/02
CPCG01N21/21G01M11/0257
Inventor 李艳秋李员赫周国栋
Owner BEIJING INSTITUTE OF TECHNOLOGYGY