System-level testing device for high-speed serial differential bus of SOC ship

Abstract

The embodiment of the invention discloses a system-level testing device for a high-speed serial differential bus of an SOC chip. The system-level testing device comprises a backboard bus, a first board card and a second board card; the first board card comprises a main control communication module, a DUT control test module and at least one function test module group, and each function test module group comprises an HDMI TX function test module, an HDMI RX function test module, an LVDS TX function test module, a USB function test module and a network port function test module; and the second board card comprises at least one SOC chip socket, each SOC chip socket is used for loading a tested SOC chip, and the HDMITX function test module, the HDMI RX function test module, the LVDS TX function test module, the USB function test module and the network port function test module are respectively used for performing communication function test on corresponding ports of the tested SOC chips. By means of the mode, the requirement for ATE can be lowered in the high-speed signal test, and the test cost is lowered.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a system-level testing device for a SOC chip high-speed serial differential bus. Background technique [0002] With the popularization of high-speed serial differential buses such as HDMI, LVDS, USB, Ethernet, MIPI, and PCIE, SOC chips in the field of consumer electronics gradually integrate these high-speed serial buses to improve integration and reduce costs. The mass production test of the posed a challenge! Various high-speed serial differential signal tests of current consumer SOC chips need to be completed by dedicated radio frequency integrated circuit automatic test equipment (Automatic Test Equipment, ATE), which makes the test cost high and development difficult, which is very unsuitable for consumer SOC. The low cost and rapid development pursued by mass production testing of chips. Contents of the invention [0003] The embodiment of the present invention pro...

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Problems solved by technology

[0002] With the popularization of high-speed serial differential buses such as HDMI, LVDS, USB, Ethernet, MIPI, and PCIE, SOC chips in the field of consumer electronics gradually integrate these high-speed serial buses to improve integration and reduce costs. The mass production test brings challenges! Various high-speed serial differential signal tests of current consumer SOC chips need to be completed by dedicated radio frequency integrated circuit automatic test equipment (Automatic Test Equipment, ATE), which makes the test cost high and development difficult, which is very unsuitable for consumer SOC. Low cost and rapid development pursued by mass production testing of chips

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