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APF parallel topology control method and device and APF system

A topology control and parallel technology, applied in the direction of circuit devices, output power conversion devices, AC network circuits, etc., can solve problems such as poor harmonic compensation accuracy, improve harmonic compensation accuracy, avoid hardware aging problems, and improve flexibility sexual effect

Active Publication Date: 2021-11-23
KEHUA DATA CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide an APF parallel topology control method and device, and an APF system to solve the technical problem of poor harmonic compensation accuracy of parallel APF modules existing in the prior art

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  • APF parallel topology control method and device and APF system
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  • APF parallel topology control method and device and APF system

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Embodiment Construction

[0052] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0053] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0054] Please refer to figure 1 , figure 1 A schematic structural diagram of an APF parallel topology control method provided by an embodiment of the present invention, the APF parallel topology control method is applied to an APF parallel topology, and the APF parallel topology includes at least two APF modules connected in parallel.

[0055] Optionally, each APF module may be powered by mains power or directly by a bat...

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Abstract

The invention provides an APF parallel topology control method and device and an APF system, and the method comprises the steps: obtaining a commercial power phase and a current load current corresponding to the APF parallel topology, and extracting an active component and a reactive component of each harmonic of the current load current based on the commercial power phase; determining at least one target APF module based on the state information of each APF module in the APF parallel topology and each sub-harmonic of the current load current; distributing the active component and the reactive component of each harmonic wave of the current load current according to a preset distribution rule, and determining an active component reference value of each harmonic wave corresponding to the target APF module and a reactive component reference value of each harmonic wave corresponding to the target APF module; and controlling the target APF module based on the active component reference value of each harmonic corresponding to the target APF module and the reactive component reference value of each harmonic corresponding to the target APF module. The harmonic compensation precision can be improved.

Description

technical field [0001] The invention belongs to the technical field of power electronics, and more specifically relates to an APF parallel topology control method and device, and an APF system. Background technique [0002] Power quality issues are attracting more and more attention. Compared with traditional passive filters and reactive power compensation devices, active power filters (Active Power Filter, APF) can better eliminate nonlinear loads. Harmonics, reactive power and unbalanced current, improve the power quality of the grid, and can realize dynamic tracking and compensation of load reactive power and harmonics. Therefore, APF active power filter has been widely used. [0003] In practical applications, in order to adapt to high-power scenarios, multiple APF modules are usually connected in parallel. In the prior art, multiple parallel-connected APF modules are usually controlled independently. Due to various problems such as analog sampling accuracy and samplin...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02J3/18H02J3/01H02M1/12
CPCH02J3/1842H02J3/01H02M1/12Y02E40/20
Inventor 吴庆彬周超伟张斌
Owner KEHUA DATA CO LTD
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