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Base material detection method and device

A technology for detection devices and substrates, which is applied to measurement devices, optical devices, and analysis of materials, etc., can solve problems such as insufficient detection accuracy and poor timeliness, and achieve high detection accuracy, improved accuracy and contrast, and improved accuracy.

Pending Publication Date: 2021-12-03
BOE TECH GRP CO LTD +1
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  • Claims
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Problems solved by technology

[0006] The purpose of the present disclosure is to provide a substrate detection device and method, and then at least to a certain extent overcome the problems of poor timeliness in finding defects and insufficient detection accuracy of substrate detection devices in the prior art

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  • Base material detection method and device
  • Base material detection method and device
  • Base material detection method and device

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Embodiment Construction

[0088] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0089] Furthermore, the drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus repeated descriptions thereof will be omitted. Some of the block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically separate entities. These functional entities ...

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Abstract

The invention relates to the technical field of base material detection, in particular to a base material detection device and method. The base material detection device comprises a first polarizing film, a first light source and a first image acquisition mechanism; the first light source is used for providing light rays entering the first polarizing film from a first direction; the first image acquisition mechanism is used for receiving light penetrating through the first polarizing film from a second direction and forming a first target image; and the first direction is opposite to the second direction.

Description

technical field [0001] The present disclosure relates to the technical field of substrate detection, and in particular, to a substrate detection device and method. Background technique [0002] In OLED display and other manufacturing fields, in order to effectively prevent and minimize the occurrence of substandard products, it is necessary to control the substrate. Among them, the measurement of the base material size and the detection of appearance defects are the two most common types of detection methods. [0003] In the prior art, the detection of the base material generally uses manual pumping or feedback of the preset position movement and motor torque value of the mechanical positioning mechanism to indirectly obtain physical information such as the length, thickness, and size of the product, but the above two detection methods There are problems of poor timeliness in finding defects and insufficient detection accuracy. [0004] Therefore, it is necessary to design...

Claims

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Application Information

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IPC IPC(8): G01N21/88G01B11/00G01B11/02G01B11/06
CPCG01N21/8851G01B11/00G01B11/02G01B11/06G01N2021/8887
Inventor 张加勤陆旭许志财王志会
Owner BOE TECH GRP CO LTD
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