Unlock instant, AI-driven research and patent intelligence for your innovation.

Integrated circuit test equipment with horizontal adjustment mechanism

A level adjustment and integrated circuit technology, which is applied in the field of integrated circuit testing equipment with a level adjustment mechanism, can solve the problems of reduced contact area, detachment of conductive tube and conductive rod, and inability to test the conductivity of components, so as to reduce the impact force , the effect of reducing damage

Inactive Publication Date: 2021-12-17
蔡文敢
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] Use a current testing machine to test the conductivity of integrated circuit components. Insert the conductive tube of the component into the card slot of the test board, so that the conductive tube contacts the conductive rod inside the card slot, and conduct performance tests after the component is energized. In order to speed up the test The test speed of the parts is moved on the ram through the cooperation of the conveying board and the motor, and the parts after the test are removed, and a horizontal adjustment mechanism is provided on both sides of the conveying board, which can adjust the horizontal angle of the conveying board; prior art When using a current testing machine to test the conductivity of integrated circuit components, due to the small diameter of the conductive tube of some components, the contact area with the conductive rod is reduced, and the vibration force is generated when the conveying plate moves, so that the component is slightly above the conveying plate. Move, the contact position between the conductive tube and the conductive rod is separated, and the conductivity test of the component cannot be performed normally

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integrated circuit test equipment with horizontal adjustment mechanism
  • Integrated circuit test equipment with horizontal adjustment mechanism
  • Integrated circuit test equipment with horizontal adjustment mechanism

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] as attached figure 1 to attach Figure 6 Shown:

[0030] The present invention provides an integrated circuit testing device with a level adjustment mechanism, the structure of which includes a body 1, a motor 2, a ram 3, a conveying plate 4, and a level adjustment mechanism 5, and the motor 2 is installed in the top middle of the body 1 near the rear , the bottom surface of the ram 3 is horizontally installed in the middle of the upper surface of the body 1, the rear end of the conveying plate 4 is connected to the front end of the motor 2, and the bottom surface is slidingly matched with the upper surface of the ram 3, and the bottom surface of the horizontal adjustment mechanism 5 is welded on The body 1 is close to the upper surfaces of the left and right sides, and is movably matched with the surfaces of both sides of the conveying plate 4 .

[0031] The delivery plate 4 includes a slide plate 41, a test plate 42, a draw-in groove 43, a clamping mechanism 44, and...

Embodiment 2

[0039] as attached Figure 7 To attach Figure 9 Shown:

[0040] Wherein, the buffer mechanism 45 includes a frame 451, a matching groove 452, a moving block 453, a support bar 454, and a clamping rod 455. The matching groove 452 passes between the bottom surface of the frame 451 and the inner bottom, and the moving block 453 is sleeved on The top of the frame 451, the upper and lower ends of the support bar 454 are respectively connected with the top of the frame 451 and the upper surfaces of the left and right ends of the moving block 453, the top of the clamping rod 455 is vertically installed on the bottom surface of the moving block 453, and the bottom of the moving block 453 The width of the frame 451 is relatively large, and it can be movably engaged with the inner wall of the frame 451 to limit the upward movement of the moving block 453. The locking rod 455 is movably engaged with the matching groove 452, which can increase the supporting force received by the moving...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses integrated circuit test equipment with a horizontal adjusting mechanism. The integrated circuit test equipment structurally comprises a machine body, a motor, a ram, a conveying plate and a horizontal adjusting mechanism. According to the invention, due to vibration force generated during moving of a conveying plate, a component slightly moves above the conveying plate, and the conductive pipe of the component can be clamped by arranging a clamping mechanism in a clamping groove, so that the vertical angle of the conductive pipe is kept, the situation that the contact position of the conductive pipe and a conductive rod is disengaged due to the vibration force effect on the component is reduced, and the conductivity of the component can be normally tested; and due to the fact that shells on the outer walls of part of the components are made of a ceramic material, when the component is quickly placed on the top of a test plate, the outer wall of the component collides with the top of the test plate to cause damage, and a buffer mechanism is arranged at the top of the test plate, so that the component can be buffered, the impact force between the top of the component and the top of the test plate is reduced, the phenomenon that the outer wall of the component is damaged is reduced, and normal use of the component is facilitated.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit testing, and more specifically relates to an integrated circuit testing device with a level adjustment mechanism. Background technique [0002] Use a current tester to test the conductivity of integrated circuit components. Insert the conductive tube of the component into the card slot of the test board, so that the conductive tube is in contact with the conductive rod inside the card slot, and conduct a performance test after the component is energized. In order to speed up the test The test speed of the parts is moved on the ram through the cooperation of the conveying board and the motor, and the parts after the test are removed, and there are horizontal adjustment mechanisms on both sides of the conveying board, which can adjust the horizontal angle of the conveying board; prior art When using a current tester to test the conductivity of integrated circuit components, due to the sma...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2851G01R31/2886G01R1/0408
Inventor 蔡文敢
Owner 蔡文敢