Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Secondary system defect data mining method based on top-k and pso

A data mining and secondary system technology, applied in text database query, electronic digital data processing, digital data information retrieval, etc., can solve problems such as cumbersome process, large manpower consumption, redundant rules, etc., achieve high quality and save manpower Effect

Pending Publication Date: 2021-12-28
STATE GRID HEBEI ELECTRIC POWER CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to overcome the need to set support, confidence and other indicators to screen the appropriate rules in order to overcome the existence of the prior art. The indicators need to be manually set. For the problem of a large amount of manpower, a secondary system defect data mining method based on top-k and pso is provided. The secondary system defect data mining method based on top-k and pso has the effect of simple process and no need for a large amount of manpower

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Secondary system defect data mining method based on top-k and pso
  • Secondary system defect data mining method based on top-k and pso
  • Secondary system defect data mining method based on top-k and pso

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0053] see Figure 1-3 , the present invention provides a technical solution: a secondary system defect data mining method based on top-k and pso, comprising the following steps:

[0054] Step 1: Equipment abnormality record: In the intelligent station, the secondary equipment is an auxiliary equipment for the primary equipment, and its reliability affects the performance of the entire power grid. Among them, most of the equipment can realize the online self-test function, and the equipment When an exception occurs, data can be uploaded through the station control layer network, and these data will also be stored in the local database. After preprocessing, these data can be used to mine frequent itemsets and association rules;

[0055] Step 2: Abnormal data preprocessing: Usually, the defect text in the secondary equipment record is manually processed by the front-line operation and maintenance personnel, so problems such as colloquialism and irregular language will inevitably...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a secondary system defect data mining method based on top-k and pso, and the method comprises the following steps: 1, recording the abnormal condition of equipment: in an intelligent station, secondary equipment is equipment which assists primary equipment, the reliability of the secondary equipment affects the performance of a whole power grid, and most of the equipment can achieve an online self-checking function; when equipment is abnormal, data can be uploaded through a station control layer network, meanwhile, the data can be stored in a local database, and the data can be used for mining frequent item sets and association rules after being preprocessed. According to the method, the support degree of each set is recorded through the set data dictionary, and then the confidence is solved by utilizing the pso algorithm and combining the target function formed by the rule number and the average confidence, so the parameter optimization is realized, and the data is not deleted as much as possible while the overall result is ensured to have higher confidence.

Description

technical field [0001] The invention relates to the technical field of system data mining, in particular to a secondary system defect data mining method based on top-k and pso. Background technique [0002] PSO is the English abbreviation of particle swarm optimization algorithm (ParticleSwarmOptimization), which is a population-based stochastic optimization technique proposed by Eberhart and Kennedy in 1995. Particle swarm algorithm imitates the flocking behavior of insects, herds of animals, birds and fish, etc. These groups look for food in a cooperative way, and each member of the group constantly changes by learning its own experience and the experience of other members. its search mode. [0003] Under normal circumstances, there are a large amount of defect data of the substation secondary system at the intelligent station terminal. These data can use correlation analysis to mine the hidden relationship behind them, so as to provide auxiliary strategies. The tradition...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/2458G06F16/33G06N3/00
CPCG06F16/2465G06F16/3344G06F16/3346G06N3/006
Inventor 王磊苏嘉成张双辉宋文乐李治张臻徐岩张寒彬单肄超
Owner STATE GRID HEBEI ELECTRIC POWER CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products