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High-speed high-precision three-dimensional detection system and method

A three-dimensional detection, high-precision technology, applied in the field of three-dimensional measurement, can solve problems such as increasing mechanical movement and image acquisition time, reducing equipment detection speed, etc., to meet diversified detection needs and expand the effect of height detection range.

Active Publication Date: 2022-01-11
英特维科技(深圳)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The method described above will inevitably increase the time of mechanical movement and image acquisition, and reduce the detection speed of the equipment

Method used

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  • High-speed high-precision three-dimensional detection system and method
  • High-speed high-precision three-dimensional detection system and method

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Effect test

Embodiment 1

[0049] Such as figure 1 , figure 2 As shown, the present invention provides a high-speed and high-precision three-dimensional detection system, including: a detection device, the detection device includes at least one first projection device 1, at least one second projection device 2, and an image acquisition device 3; A projection device 1 is used to project at least one structured light to the object to be measured, the second projection device 2 is used to project at least one line light source to the object to be measured, and the image acquisition device 3 is used to collect the first The structured light projection image and the line light source projection image projected by the projection device 1 and the second projection device 2 on the object to be measured; the processor 4 is used to acquire the structured light projection image and the line light source projection image, and according to the structured light projection image Calculate the three-dimensional heigh...

Embodiment 2

[0059] A high-speed and high-precision three-dimensional detection system. The high-speed and high-precision three-dimensional detection system provided in this embodiment is basically the same as that in Embodiment 1. The main difference lies in the number of the first projection device 1 and the second projection device 2 described in this embodiment. Both are two, that is, this embodiment is a dual-projection mode.

Embodiment 3

[0061] Such as Figure 6 As shown, this embodiment provides a high-speed and high-precision three-dimensional detection method, which is applied to the high-speed and high-precision three-dimensional detection system described in embodiments 1 and 2, including the following steps:

[0062] S1. Set the initial position, turn on the image acquisition device 3 and the second projection device 2, and cause the detection device to move relative to the object to be measured. During the movement of the image acquisition device 3, the second projection device 2 projects at least a line light source

[0063] S2. Taking the projected image of the line light source projected by the second projection device 2 on the object to be measured through the image acquisition device 3;

[0064] S3. When the image acquisition device 3 reaches the first position, turn off the second projection device 2, turn on the first projection device 1, and project at least one structured light to the object t...

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Abstract

The invention belongs to the technical field of three-dimensional measurement, and particularly discloses a high-speed high-precision three-dimensional detection system, which comprises a detection device, an image acquisition device and a control device, and is characterized in that the detection device comprises at least one first projection device, at least one second projection device and an image acquisition device; the first projection device is used for projecting at least one kind of structured light to a to-be-measured object, the second projection device is used for projecting at least one kind of linear light source to the to-be-measured object, and the image acquisition device is used for acquiring a structured light projection image and a linear light source projection image which are projected on the to-be-measured object by the first projection device and the second projection device; and the system also comprises a processor used for acquiring a structured light projection image. According to the invention, the second projection device is additionally arranged, the line light source focused in the second measurement range can effectively expand the height detection range of the system, and meanwhile, the detection speed and the detection precision are not reduced.

Description

technical field [0001] The invention relates to the technical field of three-dimensional measurement, in particular to a high-speed and high-precision three-dimensional detection system and method. Background technique [0002] With the upgrading of modern industrial high-precision and micro-manufacturing industries, the requirements for product processing accuracy and assembly accuracy are getting higher and higher. Three-dimensional automatic optical inspection technology has become the mainstream trend of industrial visual inspection. At present, 3D inspection technology has been widely used in industrial inspection, robot navigation, reverse engineering and target recognition. Especially in the electronic assembly industry, it is necessary to use machine vision to detect the solder paste quality of the surface mount production line and the components on the circuit board. Usually, three-dimensional solder paste inspection equipment (3D SPI) is used to detect the quality ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G01B11/06G06T7/60
CPCG01B11/2433G01B11/254G01B11/0608G06T7/60
Inventor 陈泰王曌
Owner 英特维科技(深圳)有限公司
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