A high-speed and high-precision three-dimensional detection system and method

A three-dimensional detection, high-precision technology, applied in the field of three-dimensional measurement, can solve the problems of reducing the detection speed of equipment, increasing the time of mechanical movement and image acquisition, and achieving the effect of expanding the detection range of height and meeting the needs of diversified detection

Active Publication Date: 2022-06-24
英特维科技(深圳)有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The method described above will inevitably increase the time of mechanical movement and image acquisition, and reduce the detection speed of the equipment

Method used

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  • A high-speed and high-precision three-dimensional detection system and method
  • A high-speed and high-precision three-dimensional detection system and method
  • A high-speed and high-precision three-dimensional detection system and method

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Experimental program
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Effect test

Embodiment 1

[0049] like figure 1 , figure 2 As shown, the present invention provides a high-speed and high-precision three-dimensional detection system, comprising: a detection device, the detection device includes at least a first projection device 1, at least a second projection device 2, and an image acquisition device 3; A projection device 1 is used to project at least one structured light to the object to be measured, the second projection device 2 is used to project at least one type of linear light source to the object to be measured, and the image acquisition device 3 is used to capture the first Structured light projection images and line light source projection images projected by the projection device 1 and the second projection device 2 on the object to be measured; the processor 4 is used to obtain the structured light projection images and the line light source projection images, according to the structured light projection images. Calculate the three-dimensional height d...

Embodiment 2

[0059] A high-speed and high-precision three-dimensional detection system. The high-speed and high-precision three-dimensional detection system provided by this embodiment is basically the same as that of the first embodiment. The main difference lies in the number of the first projection device 1 and the second projection device 2 described in this embodiment. Both are two, that is, this embodiment is a dual projection mode.

Embodiment 3

[0061] like Image 6 As shown, this embodiment provides a high-speed and high-precision three-dimensional detection method, which is applied to the high-speed and high-precision three-dimensional detection systems described in Embodiments 1 and 2, and includes the following steps:

[0062] S1. Set the initial position, turn on the image acquisition device 3 and the second projection device 2, so that the detection device and the object to be measured move relatively. During the movement of the image acquisition device 3, the second projection device 2 is used to project at least a line light source

[0063] S2, using the image acquisition device 3 to acquire the projection image of the line light source projected by the second projection device 2 on the object to be measured;

[0064] S3. When the image acquisition device 3 reaches the first position, turn off the second projection device 2, turn on the first projection device 1, and project at least one structured light to t...

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Abstract

The invention belongs to the technical field of three-dimensional measurement, and specifically discloses a high-speed and high-precision three-dimensional detection system, including: a detection device, the detection device includes at least one first projection device, at least one second projection device, and an image acquisition device; The first projection device is used to project at least one structured light to the object to be measured, the second projection device is used to project at least one line light source to the object to be measured, and the image acquisition device is used to collect the first The projection device and the second projection device project the structured light projection image and the line light source projection image on the object to be measured; the processor is used to obtain the structured light projection image, and the present invention focuses on the second measurement by adding the second projection device The line light source within the range can effectively expand the height detection range of the system without reducing the detection speed and detection accuracy.

Description

technical field [0001] The invention relates to the technical field of three-dimensional measurement, in particular to a high-speed and high-precision three-dimensional detection system and method. Background technique [0002] With the upgrading of modern industrial high-precision and micro-manufacturing industries, the requirements for product processing accuracy and assembly accuracy are getting higher and higher, and 3D automatic optical inspection technology has become the mainstream trend of industrial visual inspection. At present, 3D inspection technology has been widely used in the fields of industrial inspection, robot navigation, reverse engineering and target recognition. Especially in the electronic assembly industry, it is necessary to use machine vision to test the paste quality of the surface mount production line and the components on the circuit board. Usually, three-dimensional solder paste inspection equipment (3D SPI) is used to test the quality of solde...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25G01B11/06G06T7/60
CPCG01B11/2433G01B11/254G01B11/0608G06T7/60
Inventor 陈泰王曌
Owner 英特维科技(深圳)有限公司
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