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OLED jet printing defect detection method and device, electronic equipment and storage medium

A defect detection, location point technology, applied in measurement devices, optical testing of flaws/defects, material analysis by optical means, etc., can solve problems such as low image contrast, unsatisfactory detection result accuracy, and poor material color contrast.

Active Publication Date: 2022-01-21
JIHUA LAB
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, due to the light-emitting material layer of the OLED display device is light and thin, and the color contrast of the material is poor, when the AOI (Automated Optical Inspection) test equipment is used for detection, due to the low image contrast, the distribution of organic materials in the pixel cannot be accurately judged, so that the detection result is accurate The reliability is not ideal, and since it can only be tested after packaging, even if a bad pixel is found, it cannot be repaired, which is not conducive to improving the yield rate of the product

Method used

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  • OLED jet printing defect detection method and device, electronic equipment and storage medium
  • OLED jet printing defect detection method and device, electronic equipment and storage medium
  • OLED jet printing defect detection method and device, electronic equipment and storage medium

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Embodiment Construction

[0049]The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, not all of them. The components of the embodiments of the application generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely represents selected embodiments of the application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative efforts belong to the scope of protection of the present application.

[0050] It should b...

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Abstract

The invention belongs to the technical field of display, and discloses an OLED jet printing defect detection method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining terahertz reflection wave time domain data of at least one detection position point in a pixel point of an OLED display device which is subjected to pixel point light-emitting ink jet printing and is not packaged, the terahertz reflected wave time domain data being light intensity data of reflected waves reflected by the pixel points when terahertz pulse waves with preset light intensity periodically irradiate the detection position points of the pixel points; acquiring fingerprint spectrum data of each detection position point according to each terahertz reflected wave time domain data; extracting the maximum peak value of the fingerprint spectrum data of each detection position point; comparing the maximum peak value of the fingerprint spectrum data of each detection position point with the peak threshold value of the pixel point to judge whether the pixel point is a defective pixel; therefore, whether each pixel point has a dead pixel or not can be accurately detected before packaging, so that repair can be carried out when the dead pixel is found.

Description

technical field [0001] The present application relates to the field of display technology, in particular, to an OLED jet printing defect detection method, device, electronic equipment and storage medium. Background technique [0002] At present, when testing dead pixels (defective pixels) of OLED (Organic Light-Emitting Diode) display devices, it is usually detected with AOI (Automated Optical Inspection) testing equipment when the OLED display device is turned on. OLED display devices need to be lit, so only packaged OLED display devices can be tested. [0003] However, due to the light-emitting material layer of the OLED display device is light and thin, and the material color contrast is poor, when using AOI (Automated Optical Inspection) testing equipment for detection, due to the low image contrast, it is impossible to accurately determine the distribution of organic materials in the pixel, so that the detection result is accurate The reliability is not ideal, and sinc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/91G01N21/95G01N21/01
CPCG01N21/91G01N21/95G01N21/01G01N2021/9513G01N2021/0112
Inventor 刘竞博毛淇朱云龙吕赐兴
Owner JIHUA LAB