Time-resolved single-crystal X-ray Laue diffraction target device

A time-resolved, X-ray technology, applied in the direction of material analysis, measuring devices, and analysis materials using radiation diffraction, to achieve the effects of good time resolution, saving experiment times, and high timing synchronization accuracy

Active Publication Date: 2022-02-01
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

In related research fields such as explosion mechanics and engineering materials, there is currently no diagnostic technology that can effectively realize the in-situ observation of the microscopic mechanism of the plastic deformation or phase transition process of single crystal materials under extreme conditions such as impact. Therefore, a real-time in-situ observation A diagnostic device or method for the microscopic mechanism of plastic deformation or phase transition process of single crystal materials under extreme conditions such as impact is particularly necessary

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  • Time-resolved single-crystal X-ray Laue diffraction target device
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  • Time-resolved single-crystal X-ray Laue diffraction target device

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Embodiment Construction

[0024] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the examples and accompanying drawings. As a limitation of the present invention.

[0025] Such as figure 1 , figure 2 As shown, this embodiment provides a time-resolved single crystal X-ray Laue diffraction target device, which includes an internal hollow imaging box, and the opposite ends of the imaging box are respectively provided with a focusing assembly 8 and an X-ray Laue diffraction target assembly The imaging box is provided with an optical through hole, and the focusing and aiming assembly 8 is closed and connected outside the optical through hole; the X-ray Laue diffraction target assembly is at least provided with a diffraction hole 9 and a backlight X-ray target 1, and the backlight X-ray target 1 is located in the diffraction hole 9. It is made of a multi-layer metal film w...

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Abstract

The invention discloses a time-resolved single-crystal X-ray Laue diffraction target device which comprises a hollow imaging box, and a focusing aiming assembly and an X-ray Laue diffraction target assembly are arranged at the two opposite ends of the imaging box respectively. The imaging box is provided with an optical through hole, and the focusing aiming assembly is connected outside the optical through hole in a closed mode. The X-ray Laue diffraction target assembly is at least provided with a diffraction hole and a backlight X-ray target, the backlight X-ray target is located in an incident light path range on the outer side of the diffraction hole and is made of multiple layers of metal films, and K-series or L-series radiation photon energy corresponding to metal elements of the multiple layers of metal films is similar. The diffraction hole, the optical through hole and the focusing aiming assembly form a complete optical imaging path. The device has the characteristics of high time sequence synchronization precision and good time resolution, and is sensitive to the change of a microstructure of an atomic scale.

Description

technical field [0001] The invention relates to the technical field of single crystal X-ray diffraction diagnosis, in particular to a time-resolved single crystal X-ray Laue diffraction target device. Background technique [0002] In the process of high-speed impact or detonation, the internal microscopic atomic structure of some single crystal materials will undergo certain plastic deformation, which is manifested as the generation of dislocations or twins. With the proliferation of microscopic defects such as dislocations or twins in single crystal materials With evolution, the macroscopic mechanical properties of single crystal materials will also change, affecting their subsequent service performance. [0003] As a relatively simple model system, the microscopic mechanism of internal plastic deformation of single crystal material has laid an important foundation for further research on the microscopic mechanism of plastic deformation of powder crystal material. In relat...

Claims

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Application Information

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IPC IPC(8): G01N23/20G01N23/20008
CPCG01N23/20G01N23/20008
Inventor 胡建波李江涛王倩男杨靖张航
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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